Computer image analysis of wear debris for machine condition monitoring and fault diagnosis

Wear ◽  
1995 ◽  
Vol 181-183 ◽  
pp. 717-722 ◽  
Author(s):  
T Kirk
2005 ◽  
Vol 293-294 ◽  
pp. 777-784
Author(s):  
Guoan Yang ◽  
Zhenhuan Wu ◽  
Jin Ji Gao

In this paper, a new method for time-varying machine condition monitoring is proposed. By Choi-Williams distribution, the interference terms produced by the bilinear time-frequency transform are reduced and the fault signal is processed by the correlation analysis of the Choi-Williams distribution. For machine fault diagnosis, both the feature extractor and classifier are combined to make a decision. It is particularly suited to those who are not experts in the field. Satisfactory results have been obtained from a real example and the effectiveness of the proposed method is demonstrated.


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