Direct analysis of thin-layer chromatograms and electrophoretograms by secondary ion mass spectrometry

1987 ◽  
Vol 6 (4) ◽  
pp. 94-100 ◽  
Author(s):  
Kenneth L. Busch
Keyword(s):  
Mass Spectrometry ◽  
Thin Layer ◽  
Secondary Ion Mass Spectrometry ◽  
Direct Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Direct analysis by time-of-flight secondary ion mass spectrometry reveals action of bacterial laccase-mediator systems on both hardwood and softwood samples

2018 ◽  
Vol 164 (1) ◽  
pp. 5-16 ◽  
Author(s):  
Robyn E. Goacher ◽  
Erick J. Braham ◽  
Courtney L. Michienzi ◽  
Robert M. Flick ◽  
Alexander F. Yakunin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Direct Analysis ◽  
Bacterial Laccase ◽  
Mediator Systems ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Direct analysis of alkaloids in natural Cinchona bark and commercial extracts using time-of-flight secondary ion mass spectrometry

2018 ◽  
Vol 10 (9) ◽  
pp. 950-958 ◽  
Author(s):  
Derick N. Ateacha ◽  
Ulrike Koch ◽  
Carsten Engelhard
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Direct Analysis ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
First Time ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for the first time to characterize Cinchona alkaloids in natural Cinchona bark and commercial Cinchona extracts.

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