Thin-layer chromatography/liquid secondary ion mass spectrometry in the determination of major bile salts in dog bile

Bile Salts ◽

Ion Mass Spectrometry ◽

Layer Chromatography ◽

Quantitative analysis by thin-layer chromatography with secondary ion mass spectrometry

Chromatographia ◽

10.1007/bf02325023 ◽

1991 ◽

Vol 32 (3-4) ◽

pp. 179-181 ◽

Cited By ~ 12

Author(s):

K. Banno ◽

M. Matsuoka ◽

R. Takahashi

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Thin Layer ◽

Ion Mass Spectrometry ◽

Layer Chromatography ◽

Separation and identification of food dyes by thin-layer chromatography/liquid secondary ion mass spectrometry

Biological Mass Spectrometry ◽

10.1002/bms.1200200904 ◽

1991 ◽

Vol 20 (9) ◽

pp. 522-528 ◽

Cited By ~ 21

Author(s):

Ken-Ichi Harada ◽

Katsuyoshi Masuda ◽

Makoto Suzuki ◽

Hisao Oka

Keyword(s):

Mass Spectrometry ◽

Thin Layer ◽

Food Dyes ◽

Ion Mass Spectrometry ◽

Layer Chromatography ◽

Optimal procedure for combined high-performance thin-layer chromatography/high-sensitivity liquid secondary ion mass spectrometry

Biological Mass Spectrometry ◽

10.1002/bms.1200200403 ◽

1991 ◽

Vol 20 (4) ◽

pp. 169-178 ◽

Cited By ~ 27

Author(s):

W. Chai ◽

G. C. Cashmore ◽

R. A. Carruthers ◽

M. S. Stoll ◽

A. M. Lawson

Keyword(s):

Mass Spectrometry ◽

Thin Layer ◽

High Performance ◽

High Sensitivity ◽

Optimal Procedure ◽

Ion Mass Spectrometry ◽

Layer Chromatography ◽

Scanning thin-layer chromatography—liquid secondary ion mass spectrometry and its application for investigation of drug metabolites

Journal of Chromatography B Biomedical Sciences and Applications ◽

10.1016/0378-4347(91)80568-w ◽

1991 ◽

Vol 562 (1-2) ◽

pp. 99-110 ◽

Cited By ~ 22

Author(s):

Yuzo Nakagawa ◽

Kouji Iwatani

Keyword(s):

Mass Spectrometry ◽

Thin Layer ◽

Drug Metabolites ◽

Ion Mass Spectrometry ◽

Layer Chromatography ◽

Hydroxylation of the silica in microfabricated thin layer chromatography plates as probed by time-of-flight secondary ion mass spectrometry and diffuse reflectance infrared Fourier transform spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.5713 ◽

2014 ◽

Vol 47 (3) ◽

pp. 340-344 ◽

Cited By ~ 1

Author(s):

Supriya S. Kanyal ◽

Bhupinder Singh ◽

Cody V. Cushman ◽

Daniel T. Jankowski ◽

Matthew R. Linford

Keyword(s):

Mass Spectrometry ◽

Fourier Transform ◽

Thin Layer ◽

Diffuse Reflectance ◽

Time Of Flight ◽

Diffuse Reflectance Infrared ◽

Layer Chromatography ◽

Determination of ranolazine in tablet formulations by high-performance thin-layer chromatography—mass spectrometry using reflectance scanning densitometry

JPC - Journal of Planar Chromatography - Modern TLC ◽

10.1556/1006.2016.29.3.4 ◽

2016 ◽

Vol 29 (3) ◽

pp. 190-194 ◽

Cited By ~ 2

Author(s):

Sreedhara Rao Abburu ◽

Mohan Lakshmi Punna Rao Alapati ◽

Anima S. Dadhich ◽

Mutyala Krishnaji Rao

Keyword(s):

Mass Spectrometry ◽

Thin Layer ◽

High Performance ◽

Scanning Densitometry ◽

Chromatography Mass Spectrometry ◽

Tablet Formulations ◽

Layer Chromatography

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/02007712 ◽

2000 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/30153671 ◽

2010 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces

Analytical Chemistry ◽

10.1021/ac902280h ◽

2010 ◽

Vol 82 (7) ◽

pp. 2661-2667 ◽

Cited By ~ 17

Author(s):

Yiu-Ting R. Lau ◽

Lu-Tao Weng ◽

Kai-Mo Ng ◽

Chi-Ming Chan

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Analysis Determination