Mechanical characterization of several ion-implanted alloys: nanoindentation testing, wear testing and finite element modeling

1991 ◽  
Vol 59-60 ◽  
pp. 905-908 ◽  
Author(s):  
R.J. Bourcier ◽  
D.M. Follstaedt ◽  
M.T. Dugger ◽  
S.M. Myers
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Mechanical Characterization ◽  
Wear Testing ◽  
Element Modeling ◽  
Nanoindentation Testing ◽  
Ion Implanted

Characterization of a bionic electrolocation sensor using finite element modeling

2011 ◽  
Author(s):  
K. Mayekar ◽  
M. Gottwald ◽  
G. von der Emde ◽  
D. Damalla ◽  
H. Bousack
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Element Modeling

Finite element modeling of embolic coil deployment: Multifactor characterization of treatment effects on cerebral aneurysm hemodynamics

2013 ◽  
Vol 46 (16) ◽  
pp. 2809-2816 ◽  
Author(s):  
M. Haithem Babiker ◽  
Brian Chong ◽  
L. Fernando Gonzalez ◽  
Sachmanik Cheema ◽  
David H. Frakes
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Cerebral Aneurysm ◽  
Treatment Effects ◽  
Element Modeling

Finite Element Modeling and Characterization of Silica-Filled Rubber

2014 ◽  
Vol 2014.27 (0) ◽  
pp. 534-535
Author(s):  
Takenori HONMA ◽  
Kisaragi YASHIRO ◽  
Yoshihiro TOMITA
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Element Modeling ◽  
Filled Rubber

Finite Element Modeling of Nanoindentation Measurements of Crystalline and Amorphous Si

2000 ◽  
Vol 649 ◽  
Author(s):  
J. A. Knapp ◽  
D. M. Follstaedt ◽  
S. M. Myers ◽  
G. A. Petersen
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Finite Element Modeling ◽  
Yield Criterion ◽  
Phase Changes ◽  
Element Modeling ◽  
Atomic Force ◽  
Nanoindentation Testing ◽  
Amorphous Si ◽  
Indentation Measurement

ABSTRACTNanoindentation testing of amorphous Si layers, formed by self-ion implantation, has been performed, and their mechanical properties compared to crystalline Si. The data was analyzed using finite element modeling of the indentation measurement, allowing the properties of the thin amorphous layers to be separated from those of the underlying material. By modeling the materials as isotropic, elastic-plastic solids with the Mises yield criterion, the amorphous Si is shown to have a hardness about 15% lower than crystalline Si and an elastic modulus about 10% lower. Electron and atomic force microscopies of the indents indicate that the amorphous Si does not undergo phase changes during indentation, and that it may be somewhat more ductile than crystalline Si.

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