An analysis of the reduction of the sensitivity to magnet misalignment in low emittance synchrotron radiation sources by unifying the magnets in each straight section

1992 ◽  
Vol 313 (3) ◽  
pp. 529-545 ◽  
Author(s):  
H. Tanaka ◽  
N. Kumagai ◽  
K. Tsumaki
Keyword(s):  
Synchrotron Radiation ◽  
Straight Section ◽  
Radiation Sources ◽  
Low Emittance

scholarly journals Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

2014 ◽  
Vol 21 (5) ◽  
pp. 996-1005 ◽  
Author(s):  
Christian G. Schroer ◽  
Gerald Falkenberg
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Source Parameters ◽  
Gaussian Model ◽  
Scanning Microscopy ◽  
X Ray ◽  
Radiation Sources ◽  
Central Cone ◽  
Low Emittance

X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.

scholarly journals X‐ray monochromator system for use with synchrotron radiation sources

1981 ◽  
Vol 52 (4) ◽  
pp. 509-516 ◽  
Author(s):  
J. A. Golovchenko ◽  
R. A. Levesque ◽  
P. L. Cowan
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
Radiation Sources

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

Sign in / Sign up

Export Citation Format

Share Document