Solar simulator measurement system for large-area solar cells at standard test conditions

1985 ◽  
Vol 25 (1) ◽  
pp. 105-113 ◽  
Author(s):  
M. Böhm ◽  
H.C. Scheer ◽  
H.-G. Wagemann
2010 ◽  
Vol 1245 ◽  
Author(s):  
Mauro Pravettoni ◽  
Georgios Tzamalis ◽  
Komlan Anika ◽  
Davide Polverini ◽  
Harald Müllejans

AbstractMulti-junction thin-film devices have emerged as very promising PV materials due to reduced cost, manufacturing ease, efficiency and long term performance. The consequent growing interest of the PV community has lead to the development of new methods for the correction of indoor measurements to standard test conditions (STC), as presented in this paper. The experimental setup for spectral response measurement of multi-junction large-area thin-film modules is presented. A method for reliable corrections of indoor current-voltage characterization to STC is presented: results are compared with outdoor measurements where irradiance conditions are close to standard ones, highlighting ongoing challenges in standard characterization of such devices.


2013 ◽  
Vol 2013 ◽  
pp. 1-13 ◽  
Author(s):  
Ankita Gaur ◽  
G. N. Tiwari

In this paper, an attempt of performance evaluation of semitransparent and opaque photovoltaic (PV) modules of different generation solar cells, having the maximum efficiencies reported in the literature at standard test conditions (STC), has been carried out particularly for the months of January and June. The outdoor performance is also evaluated for the commercially available semitransparent and opaque PV modules. Annual electrical energy, capitalized cost, annualized uniform cost (unacost), and cost per unit electrical energy for both types of solar modules, namely, semitransparent and opaque have also been computed along with their characteristics curves. Semitransparent PV modules have shown higher efficiencies compared to the opaque ones. Calculations show that for the PV modules made in laboratory, CdTe exhibits the maximum annual electrical energy generation resulting into minimum cost per unit electrical energy, whereas a-Si/nc-Si possesses the maximum annual electrical energy generation giving minimum cost per unit electrical energy when commercially available solar modules are concerned. CIGS has shown the lowest capitalized cost over all other PV technologies.


2018 ◽  
Vol 6 (44) ◽  
pp. 21913-21917 ◽  
Author(s):  
Joel Troughton ◽  
Nicola Gasparini ◽  
Derya Baran

Recently developed, highly stable perovskite materials show promise for use in concentrator photovoltaics where the illumination intensity far exceeds standard test conditions.


2020 ◽  
Vol 15 ◽  

In this paper, a complete LED-based solar simulator prototype is designed and implemented. The proposed light source of this solar simulator is formed using only six different types of LEDs to simulate the AM 1.5G spectrum. In addition, the flyback converter is designed to provide the required power of the solar simulator. In order to monitor and adjust the temperature at Standard Test Conditions (STC) of 25 °C, a proposed PID controller is applied and implemented using Arduino Mega 2560. The LED-based solar simulator prototype implementation has been achieved. The performance of the solar simulator prototype has been verified and tested.


Author(s):  
Ingo Kröger ◽  
Dirk Friedrich ◽  
Stefan Winter ◽  
Elena Salis ◽  
Harald Müllejans ◽  
...  

An intercomparison of terrestrial photovoltaic (PV) calibrations was performed among a number of European calibration and testing laboratories that participated in the European Metrology Research Program (EMRP) project “PhotoClass”. The purpose of this intercomparison was to evaluate the comparability of calibration and testing services within the stated uncertainties of the individual laboratories. The calibration objects were two world photovoltaic scale (WPVS)-type reference solar cells, one made from crystalline silicon and one made from GaAs. The calibration value (CV) was the short-circuit current under standard test conditions (ISTC). In conclusion, it was found that the CVs are all consistent within the stated uncertainties. This result strengthens the reliance in the calibration chain and in the PV calibration infrastructure in Europe.


2009 ◽  
Vol 1210 ◽  
Author(s):  
Bhushan Sopori ◽  
Przemyslaw Rupnowski ◽  
Vinay Budhraja ◽  
Matthew Albert ◽  
Chandra Khattak ◽  
...  

AbstractWe describe a new technique for rapidly measuring average dislocation density and for mapping dislocation distribution of crystalline and multicrystalline silicon wafers. The wafer is etched in Sopori etch and the light scattered by dislocation etch pits is used to statistically count the pits. We also describe a unique arrangement for wafer illumination and measurement of scattered light that allows each dislocation map to be generated very rapidly—typically in less than 20 ms. The measurement system is now commercially available and has capabilities for measuring many other physical parameters of wafers and solar cells


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