D.F. Stout and M. Kaufman: Handbook of operational amplifier circuit design

This paper proposes to use Routh-Hurwitz stability criterion for analysis and design of the operational amplifier stability; this can lead to explicit stability condition derivation for operational amplifier circuit parameters, and this is very effective to understand which parameter values should be increased or decreased for the operational amplifier stability. The proposed method has been verified by three amplifiers with theoretical analysis and SPICE simulations for three operational amplifier examples.

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Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test

Microelectronics Reliability ◽

10.1016/j.microrel.2018.04.005 ◽

2018 ◽

Vol 85 ◽

pp. 19-24 ◽

Cited By ~ 1

Author(s):

Junji Sakamoto ◽

Ryoma Hirata ◽

Tadahiro Shibutani

Keyword(s):

Failure Mode ◽

Operational Amplifier ◽

Circuit Board ◽

Amplifier Circuit ◽

Mode Identification ◽

Limit Test ◽

Potential Failure ◽

Failure Mode Identification

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A Robust SOI Gain-Boosted Operational Amplifier Targeting High Temperature Precision Applications up to 300°C

Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) ◽

10.4071/hiten-paper6-aschmidt ◽

2011 ◽

Vol 2011 (HITEN) ◽

pp. 000238-000242

Author(s):

Alexander Schmidt ◽

Abdel Moneim Marzouk ◽

Holger Kappert ◽

Rainer Kokozinski

Keyword(s):

High Temperature ◽

Circuit Design ◽

Robust Design ◽

Wide Temperature Range ◽

Operational Amplifier ◽

Operating Temperature ◽

High Gain ◽

Temperature Range ◽

Op Amp ◽

Operating Temperature Range

Data acquisition and signal processing at elevated temperatures are facing various problems due to a wide temperature range operation, affecting the accuracy of the circuits' references and elementary building blocks. As the most commonly used analog building block, the operational amplifier (op-amp) with its various limitations has to be enhanced for wide temperature range operation. Thereby major effort is put into maximizing signal gain and simultaneously reaching high gain-bandwidth also for high temperatures. Future robust design approaches have to consider a growing operating temperature range and increasing device parameter mismatch due to the downsizing of integrated circuits. Addressing one of the major problems in circuit design for the next decades, compensating these effects through new design approaches will have a lasting impact on circuit design. In this paper we present a high gain operational amplifier with a folded-cascode and gain-boosted input stage, fabricated in a 1.0 μm SOI CMOS process. The operational amplifier was designed for an operating temperature range of −40…300°C. Major effort was put into a robust design approach with reduced sensitivity to temperature variations, targeting high precision applications in a high temperature environment. With a supply voltage of 5 V, the maximum simulated current consumption of the op-amp is 210 μA which leads to overall maximum power consumption of 1.05 mW. The open loop DC gain of the amplifier is expected to reach a minimum of 108 dB and a unity-gain-frequency of 1.02 MHz at a temperature of 300°C. For all temperatures the phase margin varies from 55…70 degrees for a 3 pF load.

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