carbon nanotube transistors
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Author(s):  
Xiaohui Liu ◽  
Zhiqiang Wu ◽  
Delin Hong ◽  
Weifeng Wu ◽  
Chenqiao Xue ◽  
...  

2021 ◽  
pp. 2100994
Author(s):  
William A. Gaviria Rojas ◽  
Megan E. Beck ◽  
Vinod K. Sangwan ◽  
Silu Guo ◽  
Mark C. Hersam

Nano Futures ◽  
2021 ◽  
Author(s):  
Luis Portilla ◽  
Jianwen Zhao ◽  
Jing Zhao ◽  
Luigi Occhipinti ◽  
Vincenzo Pecunia

2021 ◽  
Vol 42 (3) ◽  
pp. 367-370
Author(s):  
Jorge A. Cardenas ◽  
Shiheng Lu ◽  
Nicholas X. Williams ◽  
James L. Doherty ◽  
Aaron D. Franklin

2021 ◽  
Author(s):  
Gopalakrishnan Sundararajan

This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method for error correction called Restorative Feedback (RFB). The RFB method is a variant of Triple-Modular Redundancy (TMR) that utilizes the fault masking capabilities of the Muller C element to provide added protection against noisy transient faults. Fault tolerant properties of Muller C element is discussed and error correction capability of RFB method is demonstrated in detail.


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