Transmission electron microscopy and scanning electron microscopy characterization of GaP grown by metal-organic chemical vapor deposition on silicon substrates
2008 ◽
Vol 47
(10)
◽
pp. 7998-8002
◽
1991 ◽
1993 ◽
Vol 210
(1-2)
◽
pp. 97-105
◽
Characterization of InAs‐GaSb type II superlattices grown by metal organic chemical vapor deposition
1995 ◽
Vol 18
(2)
◽
pp. 161-168
◽
2010 ◽
Vol 256
(8)
◽
pp. 2496-2499
◽
1999 ◽
Vol 38
(Part 1, No. 9B)
◽
pp. 5437-5441
◽