Structure analysis of YBa2Cu3O7-δ thin films from X-ray diffraction data using Rietveld method

1994 ◽  
Vol 235-240 ◽  
pp. 633-634
Author(s):  
M. Pissas ◽  
E. Moraitakis ◽  
V. Phycharis ◽  
D. Niarchos
Keyword(s):  
Thin Films ◽  
Structure Analysis ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray

Structure Refinements of the Layered Intergrowth Phases SbIIISbV x A 1−x TiO6 (x≃0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

1997 ◽  
Vol 53 (6) ◽  
pp. 861-869 ◽  
Author(s):  
C. D. Ling ◽  
J. G. Thompson ◽  
S. Schmid ◽  
D. J. Cookson ◽  
R. L. Withers
Keyword(s):  
Single Crystal ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Homologous Series ◽  
Rietveld Method ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
The Family

The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA 3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xA n−xTiO4n+2 are part of a structurally homologous series.

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

2010 ◽  
Vol 45 (12) ◽  
pp. 1973-1977 ◽  
Author(s):  
S. Murugesan ◽  
N. Padhy ◽  
P. Kuppusami ◽  
U. Kamachi Mudali ◽  
E. Mohandas
Keyword(s):  
Thin Films ◽  
Structural Transition ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Titania

Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data

2003 ◽  
Vol 83 (3) ◽  
pp. 473-475 ◽  
Author(s):  
P.-O. Renault ◽  
E. Le Bourhis ◽  
P. Villain ◽  
Ph. Goudeau ◽  
K. F. Badawi ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

Crystal structure and powder X-ray diffraction data for new Tb3CuAl3Ge2 compound

2015 ◽  
Vol 30 (1) ◽  
pp. 63-66 ◽  
Author(s):  
Chao Zeng ◽  
Guoqiang Lin ◽  
Weijing Zeng ◽  
Wei He
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Unit Cell ◽  
Type Structure ◽  
X Ray Diffraction ◽  
Quaternary Compound ◽  
Space Group ◽  
X Ray

The crystal structure of new Tb3CuAl3Ge2 quaternary compound was studied by the Rietveld method from powder X-ray diffraction (XRD) data. The Tb3CuAl3Ge2 compound crystallized in the hexagonal Y3NiAl3Ge2-type structure with space group P-62m (no. 189) and lattice parameters a = 7.0041(2) Å, c = 4.1775(1) Å, V = 177.48 Å3. There is only one formula in each unit cell, Z = 1, and the density of Tb3CuAl3Ge2 is ρx = 7.1696 g cm−3. The reliability factors characterizing the Rietveld refinement results are Rp = 6.43%, Rwp = 8.65%, RB = 4.81%, and RF = 4.09%, respectively. The powder XRD data of Tb3CuAl3Ge2 were presented and the reliability of indexation is F30 = 120.9(0.0073, 34).

scholarly journals Study of Structural Properties of Annealed Cdo and Zno Thin Films

2017 ◽  
Vol 14 (2) ◽  
pp. 164-168
Author(s):  
Kishor Hurde ◽  
A. B. Lad
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Thermal Annealing ◽  
Diffraction Data ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transparent Conducting ◽  
Resistance To Oxidation

The CdO and ZnO are n- type semiconductors are transparent conducting in nature, inexpensive, mechanically stable and highly resistance to oxidation. In the present work these films have been obtained from thermal annealing of chemically deposited CdS and ZnS thin films. The structural properties of chemically deposited CdS and ZnS thin films and thermally annealed CdO and ZnO thin films have been studied. From x-ray diffraction data it is observed that annealing of the thin films at a particular temperature enhance the structural properties.

scholarly journals On the crystal structure of the ordered vacancy compound Cu3In5Te9

2019 ◽  
Vol 65 (4 Jul-Aug) ◽  
pp. 360 ◽  
Author(s):  
G. E. Delgado ◽  
C. Rincón ◽  
G. Marroquin
Keyword(s):  
Crystal Structure ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Models ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Unit Cell Parameters ◽  
Space Group ◽  
X Ray ◽  
Cell Parameters

The crystal structure of the ordered vacancy compound (OVC) Cu3In5Te9 was analyzed using powder X-ray diffraction data. Several structural models were derived from the structure of the Cu-poor Cu-In-Se compound b-Cu0.39In1.2Se2 by permuting the cations in the available site positions. The refinement of the best model by the Rietveld method in the tetragonal space group P2c (Nº 112), with unit cell parameters a = 6.1852(2) Å, c = 12.3633(9) Å, V = 472.98(4) Å3, led to Rp = 7.1 %, Rwp = 8.5 %, Rexp = 6.4 %, S = 1.3 for 162 independent reflections. This model has the following Wyckoff site atomic distribution: Cu1 in 2e (0,0,0); In1 in 2f (½,½,0), In2 in 2d (0,½,¼); Cu2-In3 in 2b (½,0,¼); in 2a (0,0,¼); Te in 8n (x,y,z).

scholarly journals Reinvestigation of the crystal structure of Ca2Ce8(SiO4)6O2 apatite by Rietveld refinement

2018 ◽  
Vol 74 (7) ◽  
pp. 955-959 ◽  
Author(s):  
Nicolas Massoni ◽  
Ronan Hegron ◽  
Lionel Campayo
Keyword(s):  
Crystal Structure ◽  
Cell Volume ◽  
Rietveld Refinement ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
Space Group ◽  
X Ray ◽  
Apatite Type

Ca2 Ln 8(SiO4)6O2 apatites with Ln = La, Ce, Pr, Nd, Sm, Eu, Gd and Tb crystallize in space group P63/m. The crystal structure of apatite-type Ca2Ce8(SiO4)6O2 [dicalcium octacerium hexakis(silicate) dioxide], which has been synthesized by calcination, was refined from powder X-ray diffraction data using the Rietveld method. A database survey shows that contrary to the previously published Ca2Ce8(SiO4)6O2 structure [Skakle et al. (2000). Powder Diffr. 15, 234–238], the cell volume of the structure reported here is consistent with those of other Ln apatites.

scholarly journals Mineralogical characterization of a highly-weathered soil by the Rietveld Method

2010 ◽  
Vol 67 (4) ◽  
pp. 454-464 ◽  
Author(s):  
André Maurício Brinatti ◽  
Yvonne Primerano Mascarenhas ◽  
Vitor Paulo Pereira ◽  
Carmen Silvia de Moya Partiti ◽  
Álvaro Macedo
Keyword(s):  
Diffraction Data ◽  
Inductively Coupled Plasma ◽  
Rietveld Method ◽  
Coarse Sand ◽  
Emission Spectrometry ◽  
X Ray Diffraction ◽  
Plasma Atomic Emission Spectrometry ◽  
Mineralogical Characterization ◽  
X Ray ◽  
Weathered Soil

The mineralogical characterization through mineral quantification of Brazilian soils by X-ray diffraction data using the Rietveld Method is not common. A mineralogical quantification of an Acric Ferralsol from the Ponta Grossa region, state of Paraná, Brazil, was carried out using this Method with X-Ray Diffraction data to verify if this method was suitable for mineral quantification of a highly-weathered soil. The A, AB and B3 horizons were fractioned to separate the different particle sizes: clay, silt, fine sand (by Stokes Law) and coarse sand fractions (by sieving), with the procedure free of chemical treatments. X-ray Fluorescence, Inductively Coupled Plasma Atomic Emission Spectrometry, Infrared Spectroscopy and Mössbauer Spectroscopy were used in order to assist the mineral identification and quantification. The Rietveld Method enabled the quantification of the present minerals. In a general way, the quantitative mineralogical characterization by the Rietveld Method revealed that quartz, gibbsite, rutile, hematite, goethite, kaolinite and halloysite were present in the clay and silt fractions of all horizons. The silt fractions of the deeper horizons were different from the more superficial ones due to the presence of large amounts of quartz. The fine and the coarse sand fractions are constituted mainly by quartz. Therefore, a mineralogical quantification of the finer fraction (clay and silt) by the Rietveld Method was successful.

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