Determination of interface state density on Au/Ta2O5/n-InP structures by different methods

Materials Science and Engineering B ◽

10.1016/0921-5107(94)90096-5 ◽

1994 ◽

Vol 28 (1-3) ◽

pp. 416-420 ◽

Author(s):

K. Boulkroun ◽

Z. Ouennoughi ◽

A. Bouziane ◽

J. Bougdira ◽

M. Elbouabdellati ◽

...

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density

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Determination of interface state density in MOSFETs using the spatial profiling charge pumping technique

Solid-State Electronics ◽

10.1016/0038-1101(92)90005-w ◽

1992 ◽

Vol 35 (8) ◽

pp. 1059-1063 ◽

Author(s):

X.M. Li ◽

M.J. Deen

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Charge Pumping ◽

Spatial Profiling

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Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

Semiconductor Physics Quantum Electronics & Optoelectronics ◽

10.15407/spqeo15.01.001 ◽

2012 ◽

Vol 15 (1) ◽

pp. 1-7 ◽

Author(s):

Yu. V. Gomeniuk ◽

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Frequency Measurements ◽

High K ◽

Silicon System ◽

High K Dielectric

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Determination of interface state density in small-geometry MOSFETs by high-low-frequency transconductance method

IEEE Electron Device Letters ◽

10.1109/55.75682 ◽

1991 ◽

Vol 12 (1) ◽

pp. 13-15 ◽

Author(s):

H.-S. Chen ◽

S.S. Li

Keyword(s):

Low Frequency ◽

Interface State ◽

State Density ◽

Interface State Density

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Electrical properties and the determination of interface state density from I–V, C–f and G–f measurements in Ir/Ru/n-InGaN Schottky barrier diode

Semiconductors ◽

10.1134/s1063782617120156 ◽

2017 ◽

Vol 51 (12) ◽

pp. 1641-1649 ◽

Author(s):

R. Padma ◽

V. Rajagopal Reddy

Keyword(s):

Electrical Properties ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode

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A novel method for the determination of the full energetic distribution of interface state density in metal/insulator/GaN structures from capacitance - voltage and photocapacitance - light intensity measurements

10.1063/1.4848283 ◽

2013 ◽

Author(s):

Maciej Matys ◽

Boguslawa Adamowicz ◽

Tamotsu Hashizume

Keyword(s):

Light Intensity ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Metal Insulator ◽

Intensity Measurements ◽

Capacitance Voltage ◽

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On the determination of interface state density in n-InP Schottky structures by current–voltage measurements

Solid-State Electronics ◽

10.1016/s0038-1101(99)00269-5 ◽

2000 ◽

Vol 44 (3) ◽

pp. 515-520 ◽

Author(s):

A Ahaitouf ◽

E Losson ◽

A Bath

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Current Voltage

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Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.185-188.53 ◽

1995 ◽

Vol 185-188 ◽

pp. 53-58

Author(s):

T. Saitoh ◽

Hisashi Hasegawa

Keyword(s):

Density Distribution ◽

Surface State ◽

Surface Recombination ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Surface Recombination Velocity ◽

Semiconductor Surfaces ◽

Recombination Velocity

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A simple approach to the capacitance technique for determination of interface state density of a metal–semiconductor contact

Solid-State Electronics ◽

10.1016/s0038-1101(97)00267-0 ◽

1998 ◽

Vol 42 (6) ◽

pp. 943-949 ◽

Author(s):

Santosh Pandey ◽

S. Kal

Keyword(s):

Interface State ◽

State Density ◽

Simple Approach ◽

Interface State Density ◽

Semiconductor Contact

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A facile growth of spray based ZnO films and device performance investigation for Schottky diodes: Determination of interface state density distribution

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2017.02.198 ◽

2017 ◽

Vol 708 ◽

pp. 55-66 ◽

Author(s):

Şakir Aydoğan ◽

Maria Luisa Grilli ◽

Mehmet Yilmaz ◽

Zakir Çaldiran ◽

Hatice Kaçuş

Keyword(s):

Density Distribution ◽

Schottky Diodes ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Zno Films ◽

Device Performance

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Determination of hot-carrier induced interface state density in polycrystalline silicon thin-film transistors

Journal of Applied Physics ◽

10.1063/1.368302 ◽

1998 ◽

Vol 84 (4) ◽

pp. 2341-2348 ◽

Author(s):

L. Mariucci ◽

G. Fortunato ◽

R. Carluccio ◽

A. Pecora ◽

S. Giovannini ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Silicon Thin Film ◽

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