Determination of interface state density in small-geometry MOSFETs by high-low-frequency transconductance method
1992 ◽
Vol 35
(8)
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pp. 1059-1063
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Keyword(s):
2013 ◽
1994 ◽
Vol 28
(1-3)
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pp. 416-420
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Keyword(s):
2000 ◽
Vol 44
(3)
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pp. 515-520
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1995 ◽
Vol 185-188
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pp. 53-58
1998 ◽
Vol 42
(6)
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pp. 943-949
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Keyword(s):
2017 ◽
Vol 708
◽
pp. 55-66
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Keyword(s):