Origin of swift heavy ion induced stress in textured ZnO thin films: An in situ X-ray diffraction study
2010 ◽
Vol 150
(37-38)
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pp. 1751-1754
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Keyword(s):
X Ray
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2007 ◽
Vol 78
(11)
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pp. 113901
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2015 ◽
Vol 3
(43)
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pp. 11357-11365
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2005 ◽
Vol 244
(1-4)
◽
pp. 281-284
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Keyword(s):
2012 ◽
Vol 407
(17)
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pp. 3437-3440
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