Origin of swift heavy ion induced stress in textured ZnO thin films: An in situ X-ray diffraction study

2010 ◽  
Vol 150 (37-38) ◽  
pp. 1751-1754 ◽  
Author(s):  
Fouran Singh ◽  
P.K. Kulriya ◽  
J.C. Pivin
2007 ◽  
Vol 78 (11) ◽  
pp. 113901 ◽  
Author(s):  
P. K. Kulriya ◽  
F. Singh ◽  
A. Tripathi ◽  
R. Ahuja ◽  
A. Kothari ◽  
...  

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.


2005 ◽  
Vol 244 (1-4) ◽  
pp. 281-284 ◽  
Author(s):  
Naohiko Kato ◽  
Ichiro Konomi ◽  
Yoshiki Seno ◽  
Tomoyoshi Motohiro

2013 ◽  
Vol 103 (24) ◽  
pp. 242904 ◽  
Author(s):  
J. Sinsheimer ◽  
S. J. Callori ◽  
B. Ziegler ◽  
B. Bein ◽  
P. V. Chinta ◽  
...  

2012 ◽  
Vol 83 (1) ◽  
pp. 013902 ◽  
Author(s):  
C. Grygiel ◽  
H. Lebius ◽  
S. Bouffard ◽  
A. Quentin ◽  
J. M. Ramillon ◽  
...  

2008 ◽  
Vol 104 (7) ◽  
pp. 073504 ◽  
Author(s):  
Jean-Marc Costantini ◽  
François Guillet ◽  
Sébastien Lambert ◽  
Dominique Grébille ◽  
François Beuneu ◽  
...  

2012 ◽  
Vol 407 (17) ◽  
pp. 3437-3440 ◽  
Author(s):  
H. Wang ◽  
G.A. Sun ◽  
B. Chen ◽  
Y.Q. Fu ◽  
X.L. Wang ◽  
...  

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