Ultraviolet photoconductive detector based on Al doped ZnO films prepared by sol–gel method

2006 ◽  
Vol 253 (2) ◽  
pp. 476-479 ◽  
Author(s):  
Zi-Qiang Xu ◽  
Hong Deng ◽  
Juan Xie ◽  
Yan Li ◽  
Xiao-Tao Zu
2003 ◽  
Vol 429 (1-2) ◽  
pp. 102-107 ◽  
Author(s):  
Xiang-Hua Wang ◽  
Jianlin Shi ◽  
Shugang Dai ◽  
Yong Yang

2010 ◽  
Vol 152-153 ◽  
pp. 868-873 ◽  
Author(s):  
Xiu Ling Lv ◽  
Yu Bo Dou ◽  
Juan Wang ◽  
Ying Xu

Al doped ZnO thin films(AZO films) was prepared by sol-gel method. The influence of Parameters of different processes on the crystallization properties, micro-morphology and optical properties of this kind of films were studied, using by X-ray diffractometer, filed emission stereoscan, spectral photometer, hall admeasuring apparatus. The results indicated that the crystallization properties, micro-morphology and optical properties of Al doped ZnO films were best on the condition that the sol density was 0.5mol/L, hat treatment temperature is 600 and there is a 8-layer coating.


2008 ◽  
Vol 148 (1-3) ◽  
pp. 35-39 ◽  
Author(s):  
Fanyong Ran ◽  
Lei Miao ◽  
Sakae Tanemura ◽  
Masaki Tanemura ◽  
Yongge Cao ◽  
...  

2013 ◽  
Vol 42 (12) ◽  
pp. 3438-3444 ◽  
Author(s):  
Jianping Xu ◽  
Shaobo Shi ◽  
Lan Li ◽  
Xiaosong Zhang ◽  
Youwei Wang ◽  
...  

2017 ◽  
Vol 05 (01) ◽  
pp. 1750004
Author(s):  
R. Vettumperumal ◽  
S. Kalyanaraman ◽  
R. Thangavel

Nanocrystalline ruthenium (Ru)-doped ZnO thin films on sapphire substrate was prepared using sol–gel method by spin coating technique. The structural and I-V characteristics of Ru doped ZnO thin films were studied from the X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) analysis and Raman spectroscopy. X-ray diffraction (XRD) results revealed that the deposited films belonged to hexagonal wurtzite structure with c-axis orientation. It is also confirmed from the Raman spectra. Enhancement of longitudinal optical (LO) phonon is observed by the strong electron–phonon interaction. An observed increment in sheet resistance with increase in dopant percentage of Ru (1–2[Formula: see text]mol%) in ZnO films was found and better I-V characteristic behavior was observed at 1[Formula: see text]mol% of Ru-doped ZnO thin films. Trap limited current flow inside the material was calculated from the log I versus log V plot in the higher voltage region.


2017 ◽  
Vol 28 (12) ◽  
pp. 8669-8674 ◽  
Author(s):  
Libing Duan ◽  
Xiaoru Zhao ◽  
Yangyang Zhang ◽  
Jianshuo Zhou ◽  
Tingjian Zhao ◽  
...  

2016 ◽  
Vol 162 ◽  
pp. 199-202 ◽  
Author(s):  
Libing Duan ◽  
Xiaoru Zhao ◽  
Yangyang Zhang ◽  
Hao Shen ◽  
Ruidi Liu

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