XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
2015 ◽
Vol 357
◽
pp. 1268-1273
◽
Keyword(s):
2004 ◽
Vol 10
(S02)
◽
pp. 1118-1119
◽
Keyword(s):
2000 ◽
Vol 147
(5)
◽
pp. 1803
◽
Keyword(s):
1994 ◽
Vol 41
(5)
◽
pp. 703-708
◽
Keyword(s):