Direct characterization of vertical molecular distributions of organic bulk heterojunction structure by photoemission spectroscopy combined with argon gas cluster ion beam sputtering

2020 ◽  
Vol 515 ◽  
pp. 146102 ◽  
Author(s):  
Dong-Jin Yun ◽  
Seong Heon Kim ◽  
JaeGwan Chung ◽  
Yong-Soo Kim ◽  
Weon-Ho Shin ◽  
...  
Keyword(s):  
Bulk Heterojunction ◽  
Ion Beam ◽  
Photoemission Spectroscopy ◽  
Ion Beam Sputtering ◽  
Argon Gas ◽  
Heterojunction Structure ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

scholarly journals Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering

2018 ◽  
Vol 20 (4) ◽  
pp. 2914-2914
Author(s):  
Dong-Jin Yun ◽  
Seyun Kim ◽  
Changhoon Jung ◽  
Chang-Seok Lee ◽  
Hiesang Sohn ◽  
...  
Keyword(s):  
Ion Beam ◽  
Photoemission Spectroscopy ◽  
Ion Beam Sputtering ◽  
Graphene Doping ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

Correction for ‘Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering’ by Dong-Jin Yun et al., Phys. Chem. Chem. Phys., 2018, 20, 615–622.

Auger electron nanoscale mapping and x-ray photoelectron spectroscopy combined with gas cluster ion beam sputtering to study an organic bulk heterojunction

2014 ◽  
Vol 104 (24) ◽  
pp. 243303 ◽  
Author(s):  
Seong Heon Kim ◽  
Sung Heo ◽  
Soo-Ghang Ihn ◽  
Sungyoung Yun ◽  
Jong Hwan Park ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Auger Electron ◽  
Bulk Heterojunction ◽  
Ion Beam ◽  
Ion Beam Sputtering ◽  
X Ray ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering

2018 ◽  
Vol 20 (1) ◽  
pp. 615-622 ◽  
Author(s):  
Dong-Jin Yun ◽  
Seyun Kim ◽  
Changhoon Jung ◽  
Chang-Seok Lee ◽  
Hiesang Sohn ◽  
...  
Keyword(s):  
Ion Beam ◽  
Photoemission Spectroscopy ◽  
Ion Beam Sputtering ◽  
Graphene Doping ◽  
Beam Sputtering ◽  
Diagnosis Method ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

We propose a novel, direct diagnosis method for graphene doping states at organic semiconductor/electrode interfaces by an in situ photoemission spectroscopy method.

Study on the molecular distribution of organic composite films by combining photoemission spectroscopy with argon gas cluster ion beam sputtering

2015 ◽  
Vol 3 (2) ◽  
pp. 276-282 ◽  
Author(s):  
Dong-Jin Yun ◽  
JaeGwan Chung ◽  
Seong Heon Kim ◽  
Yongsu Kim ◽  
Minsu Seol ◽  
...  
Keyword(s):  
Ion Beam ◽  
Composite Films ◽  
Photoemission Spectroscopy ◽  
Distribution Analysis ◽  
Ion Beam Sputtering ◽  
Molecular Distribution ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

In situ molecular distribution analysis based on photoemission spectroscopy combined with Ar gas cluster ion beam sputtering process.

GaP/Si(0 0 1) interface study by XPS in combination with Ar gas cluster ion beam sputtering

2020 ◽  
Vol 514 ◽  
pp. 145903 ◽  
Author(s):  
O. Romanyuk ◽  
I. Gordeev ◽  
A. Paszuk ◽  
O. Supplie ◽  
J.P. Stoeckmann ◽  
...  
Keyword(s):  
Ion Beam ◽  
Ion Beam Sputtering ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas ◽  
Interface Study

Probing the persistence of energy-level control effects at organic semiconductor/electrode interfaces based on photoemission spectroscopy combined with Ar gas cluster ion beam sputtering

RSC Advances ◽  
2015 ◽  
Vol 5 (95) ◽  
pp. 77814-77822 ◽  
Author(s):  
Dong-Jin Yun ◽  
Taeho Shin ◽  
SungJun Park ◽  
Youngsik Shin ◽  
YongKoo Kyung ◽  
...  
Keyword(s):  
Energy Level ◽  
Organic Semiconductor ◽  
Ion Beam ◽  
Ion Beam Sputtering ◽  
Level Control ◽  
Beam Sputtering ◽  
Cluster Ion ◽  
Semiconductor Electrode ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

Thein situPES – Ar GCIB sputtering combined analysis enable to characterize the persistence of controlled energy-level at organic semiconductor/electrode interfaces.

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