Switching and reliability issues of magnetic tunnel junctions for high-density memory device

2006 ◽  
Vol 6 ◽  
pp. e86-e91 ◽  
Author(s):  
Kwang-Seok Kim ◽  
B.K. Cho ◽  
T.W. Kim
2004 ◽  
Author(s):  
S. Ikegawa ◽  
N. Ishiwata ◽  
M. Nagamine ◽  
T. Nagase ◽  
K. Nishiyama ◽  
...  

2010 ◽  
Vol 10 (1) ◽  
pp. e87-e89 ◽  
Author(s):  
Hiroaki Yoda ◽  
Tatsuya Kishi ◽  
Toshihiko Nagase ◽  
Masatoshi Yoshikawa ◽  
Katsuya Nishiyama ◽  
...  

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