Band gap engineering in Zn(1−x)CdxO and Zn(1−x)MgxO thin films by RF sputtering

2014 ◽  
Vol 40 (1) ◽  
pp. 2135-2142 ◽  
Author(s):  
S. Gowrishankar ◽  
L. Balakrishnan ◽  
N. Gopalakrishnan
2019 ◽  
Vol 11 (4) ◽  
pp. 04015-1-04015-6
Author(s):  
H. S. Gavale ◽  
◽  
M. S. Wagh ◽  
S. R. Gosavi ◽  
◽  
...  

2012 ◽  
Vol 525 ◽  
pp. 172-174 ◽  
Author(s):  
Anup Thakur ◽  
Se-Jun Kang ◽  
Jae Yoon Baik ◽  
Hanbyeol Yoo ◽  
Ik-Jae Lee ◽  
...  

AIP Advances ◽  
2016 ◽  
Vol 6 (6) ◽  
pp. 065016 ◽  
Author(s):  
Dongyu Song ◽  
Li Li ◽  
Bingsheng Li ◽  
Yu Sui ◽  
Aidong Shen

Optik ◽  
2018 ◽  
Vol 164 ◽  
pp. 143-154 ◽  
Author(s):  
Asim Jilani ◽  
M.Sh. Abdel-wahab ◽  
H.Y. Zahran ◽  
I.S. Yahia ◽  
Attieh A. Al-Ghamdi ◽  
...  

Nano Letters ◽  
2019 ◽  
Vol 19 (7) ◽  
pp. 4627-4633 ◽  
Author(s):  
Zhenyu Wang ◽  
Tong Zhou ◽  
Tian Jiang ◽  
Hongyi Sun ◽  
Yunyi Zang ◽  
...  

2012 ◽  
Vol 488-489 ◽  
pp. 103-108 ◽  
Author(s):  
Manisha Tyagi ◽  
Monika Tomar ◽  
Vinay Gupta

The influence of substrate temperature on the UV-Visible-near-IR optical properties, namely the band gap, the Urbach energy and the refractive index of NiO thin films deposited by RF sputtering has been investigated. The optical band gap of thin films showed the blue-shift in the transmission spectra with increase in the substrate temperature which is related to variation in carrier concentration of the deposited films. Urbach energy (EU) values indicate that the films deposited at 400 oC substrate temperature show least structural disorder. The refractive index of the films is found to decrease continuously with increase in the substrate temperature at all photon energies in the visible and near-IR region, and is attributed to the decreasing packing density of the films. Introduction


2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
M. Acosta ◽  
I. Riech ◽  
E. Martín-Tovar

Zinc oxide (ZnO) thin films were grown by nonreactive RF sputtering at room temperature under varying argon pressures (PAr). Their optical band gap was found to increase from 3.58 to 4.34 eV when the argon pressure increases from 2.67 to 10.66 Pa. After annealing at 200°C and 500°C, optical band gaps decrease considerably. The observed widening of the band gap with increasingPArcan be understood as being a consequence of the poorer crystallinity of films grown at higher pressures. Measurements of morphological and electrical properties of these films correlate well with this picture. Our main aim is to understand the effects ofPAron several physical properties of the films, and most importantly on its optical band gap.


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