High resolution FTIR investigation of 12C2H2 in the FIR spectral range using synchrotron radiation

2010 ◽  
Vol 491 (1-3) ◽  
pp. 17-19 ◽  
Author(s):  
B. Amyay ◽  
M. Herman ◽  
A. Fayt ◽  
L. Fusina ◽  
A. Predoi-Cross
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Spectral Range ◽  
Ftir Investigation

ANALYSIS OF THE ATOMIC Fe3d AND 4s PARTIAL CROSS SECTIONS IN THE REGION OF THE 3p → 3d GIANT RESONANCE

2002 ◽  
Vol 09 (02) ◽  
pp. 1229-1233 ◽  
Author(s):  
S. B. WHITFIELD ◽  
R. WEHLITZ ◽  
M. O. KRAUSE ◽  
C. D. CALDWELL
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Cross Sections ◽  
Systematic Study ◽  
Giant Resonance ◽  
Fitting Procedure

Using the technique of photoelectron spectrometry in conjunction with synchrotron radiation, we have carried out a systematic study of the partial cross sections of the main photoelectron lines arising from the ionization of the 3d and 4s subshells of atomic Fe in the vicinity of 3p → 3d autoionizing resonances. Our results confirm the presence of two broad and intense resonances which have been observed earlier. However, our high resolution results also clearly indicate the presence of numerous other weaker resonances. Through a fitting procedure we were able to accurately determine both resonance widths and positions.

Broadband THz high-resolution interferometry using coherent synchrotron radiation

2012 ◽  
Author(s):  
J. Barros ◽  
L. Manceron ◽  
J.-B. Brubach ◽  
C. Evain ◽  
M.-E. Couprie ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Coherent Synchrotron Radiation

High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography

2005 ◽  
Vol 86 (7) ◽  
pp. 071915 ◽  
Author(s):  
L. Helfen ◽  
T. Baumbach ◽  
P. Mikulík ◽  
D. Kiel ◽  
P. Pernot ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Computed Laminography

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
Reciprocal Space Mapping ◽  
3 Dimensional ◽  
Individual Grains

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

Rapid diagnosis of electromigration induced failure time of Pb-free flip chip solder joints by high resolution synchrotron radiation laminography

2011 ◽  
Vol 99 (8) ◽  
pp. 082114 ◽  
Author(s):  
Tian Tian ◽  
Feng Xu ◽  
Jung Kyu Han ◽  
Daechul Choi ◽  
Yin Cheng ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Flip Chip ◽  
Solder Joints ◽  
Failure Time ◽  
Rapid Diagnosis

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

High-Resolution FTIR Investigation of the ν2 Band of KrF2 and XeF2

1994 ◽  
Vol 164 (1) ◽  
pp. 84-96 ◽  
Author(s):  
H. Burger ◽  
S.Y. Ma ◽  
B.P. Winnewisser
Keyword(s):  
High Resolution ◽  
Ftir Investigation
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