3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
Reciprocal Space Mapping ◽  
3 Dimensional ◽  
Individual Grains

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
pp. 2353-2358
Author(s):  
Ulrich Lienert ◽  
Jon Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Energy ◽  
Bulk Materials ◽  
3 Dimensional

Local Orientation Measurements in 3D

2005 ◽  
Vol 105 ◽  
pp. 49-54 ◽  
Author(s):  
Dorte Juul Jensen
Keyword(s):  
Tensile Deformation ◽  
High Energy ◽  
X Rays ◽  
X Ray Diffraction ◽  
3 Dimensional ◽  
Grain Structures ◽  
Individual Grains ◽  
Kinetics Of

The 3 Dimensional X-Ray Diffraction (3DXRD) method is presented and its potentials illustrated by examples. The 3DXRD method is based on diffraction of high energy X-rays and allows fast and nondestructive 3D characterization of the local distribution of crystallographic orientations in the bulk. The spatial resolution is about 1x5x5 µm but diffraction from microstructural elements as small as 100 nm may be monitored within suitable samples. As examples of the use of the 3DXRD method, it is chosen to present results for complete 3D characterization of grain structures, in-situ “filming” of the growth of one interior grain during recrystallization, recrystallization kinetics of individual grains and crystallographic rotations of individual grains during tensile deformation.

scholarly journals Multi-analyser detector (MAD) for high-resolution and high-energy powder X-ray diffraction

2021 ◽  
Vol 28 (1) ◽  
pp. 146-157
Author(s):  
Alexander Schökel ◽  
Martin Etter ◽  
Andreas Berghäuser ◽  
Alexander Horst ◽  
Dirk Lindackers ◽  
...  
Keyword(s):  
High Resolution ◽  
Signal To Noise Ratio ◽  
High Energy ◽  
High Signal ◽  
X Ray Diffraction ◽  
Stepper Motors ◽  
In Operando ◽  
Characterization Of Materials

For high-resolution powder diffraction in material science, high photon energies are necessary, especially for in situ and in operando experiments. For this purpose, a multi-analyser detector (MAD) was developed for the high-energy beamline P02.1 at PETRA III of the Deutsches Elektronen-Synchrotron (DESY). In order to be able to adjust the detector for the high photon energies of 60 keV, an individually adjustable analyser–crystal setup was designed. The adjustment is performed via piezo stepper motors for each of the ten channels. The detector shows a low and flat background as well as a high signal-to-noise ratio. A range of standard materials were measured for characterizing the performance. Two exemplary experiments were performed to demonstrate the potential for sophisticated structural analysis with the MAD: (i) the structure of a complex material based on strontium niobate titanate and strontium niobate zirconate was determined and (ii) an in situ stroboscopy experiment with an applied electric field on a highly absorbing piezoceramic was performed. These experiments demonstrate the capabilities of the new MAD, which advances the frontiers of the structural characterization of materials.

Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique

2019 ◽  
Vol 64 (4) ◽  
pp. 545-552 ◽  
Author(s):  
A. Yu. Seregin ◽  
P. A. Prosekov ◽  
F. N. Chukhovsky ◽  
Yu. A. Volkovsky ◽  
A. E. Blagov ◽  
...  
Keyword(s):  
High Resolution ◽  
Theoretical Study ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
X Ray

Characterization Of Si-Doped GaN on (00.1) Sapphire Grown by MOCVD

1997 ◽  
Vol 482 ◽  
Author(s):  
Chang Soo Kim ◽  
Dong-Kun Lee ◽  
Cheul-Ro Lee ◽  
Sam Kyu Now ◽  
In-Hwan Lee ◽  
...  
Keyword(s):  
Hall Mobility ◽  
Strain Relaxation ◽  
Mapping Technique ◽  
Yellow Luminescence ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
Peak Intensity Ratio ◽  
Si Doped ◽  
Good Agreement

AbstractWe investigated structural, electrical and optical properties and their relationships for MOCVD grown Si-doped GaN with different doping levels. The changes in structural properties such as strain, crystallinity and strain relaxation as a function of carrier concentrations were measured by high-resolution triple-axis X-ray diffraction and reciprocal space mapping technique. As the carrier concentration of the samples increases from 1.6×1018 to 9.5×1018/cm3 Hall mobility decreases from 222 to 170cm2/Vsec, and peak intensity ratio of band edge to yellow luminescence in photoluminescence spectra decreases too. The variation of mosaic spread along [00.1] direction determined from full width at half maximum(FWHM) of GaN (00.2) peaks shows good agreement with the variation in Hall mobility. In addition, dislocation density determined from FWHM of (10.2) peaks is shown to be related to the variation in the intensity of yellow luminescence in PL spectra.

Evaluation of Fatigue Damage by Diffraction Contrast Tomography Using Synchrotron Radiation

2014 ◽  
Vol 783-786 ◽  
pp. 2359-2364 ◽  
Author(s):  
Daiki Shiozawa ◽  
Yoshikazu Nakai ◽  
Ryotaro Miura ◽  
Shota Matsuda
Keyword(s):  
Synchrotron Radiation ◽  
Fatigue Damage ◽  
Grain Orientation ◽  
Three Dimensional ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Diffraction Contrast ◽  
Three Dimensional Mapping ◽  
Grain Orientation Spread ◽  
Individual Grains

The three dimensional grain mapping technique for polycrystalline material, which is called X-ray diffraction contrast tomography (DCT) has proposed. In the present study, the measurement of DCT was conducted in SPring-8, which is the brightest synchrotron radiation facility in Japan, and the condition of measurement and data procedure are discussed. Developed technique was applied to aluminium alloy and stainless steel. The shape and location of grain could be determined by the developed three-dimensional mapping technique using the apparatus in a bending beam line of SPring-8. To evaluate plastic deformation, the grain orientation spreads of individual grains were measured. The grain orientation spread is caused by the mosaicity, which relates to the dislocation structure in a grain. The grain orientation spread was found to increase with increasing plastic strain. Fatigue damage also could be evaluated by the grain orientation spread in the DCT measurement.

Characterization of SiC epilayers using high-resolution X-ray diffraction and synchrotron topography imaging

2004 ◽  
Vol 815 ◽  
Author(s):  
Xianrong Huang ◽  
Michael Dudley ◽  
Robert S. Okojie
Keyword(s):  
High Resolution ◽  
Strain Energy ◽  
Nitrogen Doping ◽  
Alloy Composition ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
Lattice Contraction ◽  
X Ray ◽  
Nitrogen Doped

AbstractHigh-resolution X-ray diffraction is one of the most powerful and widely used techniques for accurate characterization of the lattice parameters, mismatch, alloy composition, dopant concentrations, and thickness of epitaxial materials. In this presentation, we use a series of advanced X-ray diffraction techniques, including double-axis diffraction, triple-axis diffraction, reciprocal space mapping (RSM), and synchrotron white beam X-ray topography, to characterize highly nitrogen-doped homoepitaxial 4H-SiC epilayers. Measurements reported in this work have determined that in single crystal 4H-SiC, increasing the nitrogen doping level above 4 × 1017 cm#x2212;3 results in corresponding increase in lattice contraction. The increase in epilayer/mismatch mismatch with doping, and the corresponding strain energy, is attributed to the substitutional nitrogen incorporated preferentially in the host carbon sites of the 4H-SiC epilayer. Also, significant lattice tilts, generally along the [1120] offcut direction (8°), exist, which are believed to be induced by the Nagai epitaxial tilt.

Evaluation of Fatigue Damage by Diffraction Contrast Tomography Using Synchrotron Radiation

2014 ◽  
Vol 891-892 ◽  
pp. 600-605 ◽  
Author(s):  
Daiki Shiozawa ◽  
Yoshikazu Nakai ◽  
Ryotaro Miura ◽  
Shota Matsuda
Keyword(s):  
Synchrotron Radiation ◽  
Fatigue Damage ◽  
Grain Orientation ◽  
Three Dimensional ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Diffraction Contrast ◽  
Three Dimensional Mapping ◽  
Grain Orientation Spread ◽  
Individual Grains

The three dimensional grain mapping technique for polycrystalline material, which is called X-ray diffraction contrast tomography (DCT) has proposed. In the present study, the measurement of DCT was conducted in SPring-8, which is the brightest synchrotron radiation facility in Japan, and the condition of measurement and data procedure are discussed. Developed technique was applied to aluminium alloy and stainless steel. The shape and location of grain could be determined by the developed three-dimensional mapping technique using the apparatus in a bending beam line of SPring-8. To evaluate plastic deformation, the grain orientation spreads of individual grains were measured. The grain orientation spread is caused by the mosaicity, which relates to the dislocation structure in a grain. The grain orientation spread was found to increase with increasing plastic strain. Fatigue damage also could be evaluated by the grain orientation spread in the DCT measurement.

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