Effect of anodic oxidation time on resistive switching memory behavior based on amorphous TiO2 thin films device
2018 ◽
Vol 706
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pp. 477-482
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2019 ◽
Vol 45
(5)
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pp. 5724-5730
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2017 ◽
Vol 32
(2)
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pp. 025009
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2019 ◽
Vol 30
(19)
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pp. 17725-17734
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2020 ◽
Vol 12
(2)
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pp. 02035-1-02035-4
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2017 ◽
Vol 5
(25)
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pp. 6319-6327
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2015 ◽
Vol 17
(44)
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pp. 29978-29984
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