Tunable defect engineering in TiON thin films by multi-step sputtering processes: from a Schottky diode to resistive switching memory
2017 ◽
Vol 5
(25)
◽
pp. 6319-6327
◽
Keyword(s):
The role of defect engineering is essential in resistive switching memory.
2019 ◽
Vol 45
(5)
◽
pp. 5724-5730
◽
Keyword(s):
2017 ◽
Vol 32
(2)
◽
pp. 025009
◽
Keyword(s):
Keyword(s):
2019 ◽
Vol 30
(19)
◽
pp. 17725-17734
◽
2014 ◽
Vol 61
(4)
◽
pp. 1071-1076
◽
Keyword(s):
2019 ◽
Vol 30
(20)
◽
pp. 18744-18752
Keyword(s):
2020 ◽
Vol 12
(2)
◽
pp. 02035-1-02035-4
Keyword(s):