Calibration of boron concentration in CVD single crystal diamond combining ultralow energy secondary ions mass spectrometry and high resolution X-ray diffraction

2007 ◽  
Vol 16 (4-7) ◽  
pp. 809-814 ◽  
Author(s):  
B. Guzmán de la Mata ◽  
A. Sanz-Hervás ◽  
M.G. Dowsett ◽  
M. Schwitters ◽  
D. Twitchen
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Single Crystal ◽  
Boron Concentration ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ultralow Energy ◽  
Secondary Ions ◽  
Single Crystal Diamond

High resolution X-ray diffraction study of single crystal diamond radiators

2012 ◽  
Vol 209 (9) ◽  
pp. 1786-1791 ◽  
Author(s):  
Guangliang Yang ◽  
Ken Livingston ◽  
Richard Jones ◽  
Franz Klein
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Single Crystal Diamond

Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- and 6H-SiC seeds

2004 ◽  
Vol 831 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Rafael Dalmau ◽  
Raoul Schlesser ◽  
Zlatko Sitar
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Large Diameter ◽  
Laser Diodes ◽  
Growth Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
White Beam ◽  
Strain Data ◽  
Growth Experiments

ABSTRACTFor nitride based devices such as LEDs, high power FETs and laser diodes, single crystal substrates of AlN are highly desirable. While the sublimation technique is suitable for growing bulk AlN crystals, appropriate seeds are also necessary for growing large diameter oriented boules. 4H- and 6H-SiC substrates which are readily available commercially can potentially be implemented as seeds for bulk AlN growth. However, issues regarding SiC decomposition at high temperatures, thermal expansion mismatch, single crystal growth, etc. need to be addressed. Towards this end, a series of growth experiments have been carried out in a resistively heated reactor using on and off-axis 4H- and 6H-SiC substrates as seeds for AlN growth from the vapor phase. Several hundred microns thick AlN layers have been grown under different growth conditions. Synchrotron white beam x-ray topography (SWBXT) has been used to map the defect distribution in the grown layers and high resolution triple axis x-ray diffraction (HRTXD) experiments were carried out to record reciprocal space maps from which tilt, mismatch and strain data can be obtained. These results are analyzed with respect to the growth conditions in order to gain a better understanding of this growth process.

scholarly journals A Covalent Organic Cage Compound Acting as a Supramolecular Shadow Mask for the Regioselective Functionalization of C60

2020 ◽  
Author(s):  
Viktoria Leonhardt ◽  
Stefanie Fimmel ◽  
Ana-Maria Krause ◽  
Florian Beuerle
Keyword(s):  
Mass Spectrometry ◽  
Single Crystal ◽  
High Selectivity ◽  
Shadow Mask ◽  
X Ray Diffraction ◽  
X Ray ◽  
Trigonal Bipyramidal ◽  
Cage Compound ◽  
Vis Spectroscopy ◽  
Regioselective Functionalization

<div><div><div><p>A trigonal-bipyramidal covalent organic cage compound serves as an efficient host to form stable 1:1-complexes with C60 and C70. Fullerene encapsulation has been comprehensively studied by NMR and UV/Vis spectroscopy, mass spectrometry as well as single-crystal X-ray diffraction. Exohedral functionalization of encapsulated C60 via threefold Prato reaction revealed high selectivity for the symmetry-matched all-trans-3 addition pattern.</p></div></div></div>

Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

2008 ◽  
Vol 41 (6) ◽  
pp. 1134-1139 ◽  
Author(s):  
Youli Li ◽  
Roy Beck ◽  
Tuo Huang ◽  
Myung Chul Choi ◽  
Morito Divinagracia
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Small Angle ◽  
Incident Beam ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
Metal Base ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

scholarly journals [Ni(OH)3W6O18(OCH2)3CCH2OH]4−: the first tris-functionalized Anderson-type heteropolytungstate

2016 ◽  
Vol 52 (59) ◽  
pp. 9263-9266 ◽  
Author(s):  
Nadiia I. Gumerova ◽  
Alexander Roller ◽  
Annette Rompel
Keyword(s):  
Mass Spectrometry ◽  
Ir Spectroscopy ◽  
Single Crystal ◽  
Electrospray Ionization ◽  
Electrospray Ionization Mass Spectrometry ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
X Ray Diffraction ◽  
X Ray

Na2[TMA]2[Ni(OH)3W6O18(OCH2)3CCH2OH]·9H2O represents the first covalent tris-functionalized Anderson-type heteropolytungstate and was characterized by single-crystal X-ray diffraction, electrospray ionization mass spectrometry, TGA and IR spectroscopy.

Domain separation in single-crystal (ND4)2Cu(SO4)2⋅6D2O studied by x-ray diffraction at high resolution

1993 ◽  
Vol 48 (18) ◽  
pp. 13372-13377 ◽  
Author(s):  
Brian N. Figgis ◽  
Philip A. Reynolds ◽  
Jonathan C. Hanson ◽  
Ilpo Mutikainen
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Domain Separation

1,3,5-Tris[(trimethylstannyl)ethynyl]- 1,3,5-trimethyl-1,3,5-trisilacyclohexane

2016 ◽  
Vol 71 (1) ◽  
pp. 81-84 ◽  
Author(s):  
Eugen Weisheim ◽  
Hans-Georg Stammler ◽  
Norbert W. Mitzel
Keyword(s):  
Mass Spectrometry ◽  
Ir Spectroscopy ◽  
Single Crystal ◽  
Elemental Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ft Ir ◽  
Ft Ir Spectroscopy

AbstractThe reaction of 1,3,5-triethynyl-1,3,5-trimethyl- 1,3,5-trisilacyclohexane with (dimethylamino)trimethylstannane afforded 1,3,5-tris[(trimethylstannyl)ethynyl]- 1,3,5-trimethyl-1,3,5-trisilacyclohexane with tin-functionalised ethynyl groups. The compound was characterized by single-crystal X-ray diffraction, elemental analysis, mass spectrometry, NMR and FT-IR spectroscopy.

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