Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range

2010 ◽  
Vol 19 (2-3) ◽  
pp. 114-122 ◽  
Author(s):  
Daniel Franta ◽  
David Nečas ◽  
Lenka Zajíčková ◽  
Vilma Buršíková ◽  
Christoph Cobet
1992 ◽  
Vol 285 ◽  
Author(s):  
S. Leppävuori ◽  
J. Levoska ◽  
J. Vaara ◽  
O. Kusmartseva

ABSTRACTDiamond-like carbon (DLC) thin films were prepared by laser ablation deposition. The deposition process was carried out in a vacuum chamber at a base pressure of about 10−5 mbar using the focused beam from either an Nd:YAG laser or an XeCl excimer laser and a pyrolytic graphite target. The peak power density of the laser beam was about 108 W/cm2, and 1010 W/cm2. respectively. The effect of varying power density of the laser beam also was examined. The films were deposited on fused silica and silicon single crystal substrates between room temperature and 600 °C with and without hydrogen addition. The properties of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), micro-Raman and Fourier transform infrared (FTIR) spectrometry, electrical conductivity and optical measurements. The best films were insulating (σ<10−6 Ω−1 cm−1), hard, partly transparent (optical gap 1.3 − 2.2 eV) and smooth without any particulates on the surface.


2012 ◽  
Vol 38 (7) ◽  
pp. 609-612 ◽  
Author(s):  
N. I. Klyui ◽  
A. I. Liptuga ◽  
V. B. Lozinskii ◽  
A. N. Lukyanov ◽  
A. P. Oksanich ◽  
...  

1996 ◽  
Vol 06 (C5) ◽  
pp. C5-91-C5-95 ◽  
Author(s):  
S. Lee ◽  
B. Chung ◽  
T.-Y. Ko ◽  
H. Cho ◽  
D. Jeon ◽  
...  

2014 ◽  
Vol 29 (9) ◽  
pp. 941
Author(s):  
JIANG Jin-Long ◽  
WANG Qiong ◽  
HUANG Hao ◽  
ZHANG Xia ◽  
WANG Yu-Bao ◽  
...  

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.


2002 ◽  
Author(s):  
Xiao Liu ◽  
D. M. Photiadis ◽  
J. A. Bucaro ◽  
J. F. Vignola ◽  
B. H. Houston ◽  
...  

Vacuum ◽  
2021 ◽  
pp. 110351
Author(s):  
Vilius Dovydaitis ◽  
Liutauras Marcinauskas ◽  
Paola Ayala ◽  
Enrico Gnecco ◽  
Johnny Chimborazo ◽  
...  

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