scholarly journals Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

2017 ◽  
Vol 80 ◽  
pp. 147-152 ◽  
Author(s):  
Robert Harniman ◽  
Paul W. May ◽  
Oliver J.L. Fox
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Grain Boundaries ◽  
Direct Observation ◽  
Electron Emission ◽  
Cvd Diamond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Diamond Grain

scholarly journals Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy

Carbon ◽  
2015 ◽  
Vol 94 ◽  
pp. 386-395 ◽  
Author(s):  
Robert L. Harniman ◽  
Oliver J.L. Fox ◽  
Wiebke Janssen ◽  
Sien Drijkoningen ◽  
Ken Haenen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundaries ◽  
Direct Observation ◽  
Electron Emission ◽  
Cvd Diamond ◽  
Force Microscopy ◽  
Atomic Force

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Surface morphology studies on sublimation grown GaN by atomic force microscopy

1999 ◽  
Vol 200 (3-4) ◽  
pp. 348-352 ◽  
Author(s):  
R.S Qhalid Fareed ◽  
S Tottori ◽  
K Nishino ◽  
S Sakai
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior
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