Thermal performance of flat vapor chamber heat spreader

2008 ◽  
Vol 49 (6) ◽  
pp. 1774-1784 ◽  
Author(s):  
Shou-Shing Hsieh ◽  
Ron-Yu Lee ◽  
Jin-Cherng Shyu ◽  
Shao-Wen Chen
Author(s):  
David H. Altman ◽  
Joseph R. Wasniewski ◽  
Mark T. North ◽  
Sungwon S. Kim ◽  
Timothy S. Fisher

Spreading of high-flux electronics heat is a critical part of any packaging design. This need is particularly profound in advanced devices where the dissipated heat fluxes have been driven well over 100W/cm2. To address this challenge, researchers at Raytheon, Thermacore and Purdue are engaged in the development and characterization of a low resistance, coefficient of thermal expansion (CTE)-matched multi-chip vapor chamber heat spreader, which utilizes capillary driven two-phase heat transport. The vapor chamber technology under development overcomes the limitations of state-of-the-art approaches by combining scaled-down sintered Cu powder and nanostructured materials in the vapor chamber wick to achieve low thermal resistance. Cu-coated vertically aligned carbon nanotubes is the nanostructure of choice in this development. Unique design and construction techniques are employed to achieve CTE-matching with a variety of device and packaging materials in a low-profile form-factor. This paper describes the materials, design, construction and characterization of these vapor chambers. Results from experiments conducted using a unique high-heat flux capable 1DSS test facility are presented, exploring the effects of various microscopic wick configurations, CNT-functionalizations and fluid charges on thermal performance. The impacts of evaporator wick patterning, CNT evaporator functionalization and CNT condenser functionalization on performance are assessed and compared to monolithic Cu wick configurations. Thermal performance is explained as a function of applied heat flux and temperature through the identification of dominant component thermal resistances and heat transfer mechanisms. Finally, thermal performance results are compared to an equivalent solid conductor heat spreader, demonstrating a >40% reduction in thermal resistance. These results indicate great promise for the use of such novel vapor chamber technology in thickness-constrained high heat flux device packaging applications.


2015 ◽  
Vol 61 ◽  
pp. 130-143 ◽  
Author(s):  
Shyy Woei Chang ◽  
Kuei Feng Chiang ◽  
Tsung Han Lee

2011 ◽  
Vol 2011 (1) ◽  
pp. 000361-000366
Author(s):  
Don Willis ◽  
Gary Gu ◽  
Daniel Jin ◽  
Rob Dry

The typical package available for high power GaN application has the devices directly attached onto a metal flange, which could contribute significantly to the overall thermal resistance. This paper discusses an alternative approach to packaging both single and multiple devices through a heat spreader, which could potentially improve thermal performance and bring significant benefits to assembly in yields and cost. However, the heat spreader could also introduce significant CTE mis-match and potential concerns in reliability. Nonlinear 3D finite element analysis (FEA) was conducted to characterize the thermal performance and evaluate mechanical/reliability concerns. Thermal modeling considered single and multiple die applications, and the results show13–15% thermal improvement with the copper heat spreader. Mechanical analysis focused on the thermal loads of the die attach and solder reflow processes. It reveals that the die attach process is more critical as shown in the higher stress due to higher thermal load, but stress/strain levels appear to be acceptable. Thus, this alternative approach could be a viable solution.


2020 ◽  
Vol 166 ◽  
pp. 114686 ◽  
Author(s):  
Liang Chen ◽  
Daxiang Deng ◽  
Qingsong Huang ◽  
Xinhai Xu ◽  
Yingxi Xie

2019 ◽  
Vol 153 ◽  
pp. 361-368 ◽  
Author(s):  
Mengyan Wang ◽  
Wenzhi Cui ◽  
Yuepan Hou

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