scholarly journals When faults diverge – High resolution imaging of an intra-fault zone in an urban environment. A case study from the city of Tiberias, Israel

2021 ◽  
pp. 106454
Author(s):  
Michael Lazar ◽  
Uri Basson ◽  
Ram Ben-David ◽  
Judah Coddington
Keyword(s):  
High Resolution ◽  
Urban Environment ◽  
Fault Zone ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
The City

scholarly journals High-resolution Imaging of Fault Zone Structures with Seismic Fault Zone Waves

2007 ◽  
Vol SpecialIssue ◽  
pp. 78-79 ◽  
Author(s):  
Y. Ben-Zion ◽  
Z. Peng ◽  
M. Lewis ◽  
J. McGuire
Keyword(s):  
High Resolution ◽  
Fault Zone ◽  
High Resolution Imaging ◽  
Seismic Fault ◽  
Resolution Imaging ◽  
Fault Zone Structures ◽  
Fault Zone Waves

No abstract available. <br><br> doi:<a href="http://dx.doi.org/10.2204/iodp.sd.s01.23.2007" target="_blank">10.2204/iodp.sd.s01.23.2007</a>

High Resolution Imaging by Wave Equation Reflectivity Inversion: A MAZ Case Study from Jequitinhonha Basin, Brazil

2017 ◽  
Author(s):  
Alejandro Alcudia-Leon* ◽  
Alejandro Valenciano ◽  
Shaoping Lu ◽  
Nizar Chemingui ◽  
Sverre Brandsberg-Dahl
Keyword(s):  
Wave Equation ◽  
High Resolution ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Reflectivity Inversion

High‐resolution imaging of fault zone structures

2006 ◽  
Vol 119 (5) ◽  
pp. 3308-3308
Author(s):  
Zhigang Peng ◽  
Yehuda Ben‐Zion
Keyword(s):  
High Resolution ◽  
Fault Zone ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Fault Zone Structures

High-resolution imaging of the San Jacinto fault zone with a dense seismic array and local seismic noise

2015 ◽  
Vol 138 (3) ◽  
pp. 1764-1764 ◽  
Author(s):  
Philippe Roux ◽  
Albanne Lecointre ◽  
Ludovic Moreau ◽  
Michel Campillo ◽  
Yehuda Ben-Zion ◽  
...  
Keyword(s):  
High Resolution ◽  
Fault Zone ◽  
Seismic Noise ◽  
Seismic Array ◽  
High Resolution Imaging ◽  
San Jacinto Fault ◽  
San Jacinto Fault Zone ◽  
Resolution Imaging ◽  
Dense Seismic Array

scholarly journals 3-D GPR data analysis for high-resolution imaging of shallow subsurface faults: the Mt Vettore case study (Central Apennines, Italy)

2014 ◽  
Vol 198 (1) ◽  
pp. 609-621 ◽  
Author(s):  
Maurizio Ercoli ◽  
Cristina Pauselli ◽  
Alessandro Frigeri ◽  
Emanuele Forte ◽  
Costanzo Federico
Keyword(s):  
Data Analysis ◽  
High Resolution ◽  
High Resolution Imaging ◽  
Central Apennines ◽  
Shallow Subsurface ◽  
Resolution Imaging

scholarly journals High-Resolution Imaging within the Urban Environment -- "What's beneath our streets"!

Fact Sheet ◽  
2004 ◽  
Author(s):  
Jackson K. Odum ◽  
Robert A. Williams ◽  
William J. Stephenson ◽  
David M. Worley
Keyword(s):  
High Resolution ◽  
Urban Environment ◽  
High Resolution Imaging ◽  
Resolution Imaging

Very High-Resolution Imaging of the City of Goma (North Kivu, D.R. Congo) Using SFM-MVS Photogrammetry

2018 ◽  
Author(s):  
Benoit Smets ◽  
Caroline Michellier ◽  
Adalbert M. Syavulisembo ◽  
Gustave Munganea ◽  
Nicolas Doreye ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
North Kivu ◽  
The City ◽  
Very High

Alternative approaches to ultra-high resolution imaging

1991 ◽  
Vol 49 ◽  
pp. 650-651
Author(s):  
J.M. Cowley
Keyword(s):  
High Resolution ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
High Resolution Imaging ◽  
General Applicability ◽  
Resolution Electron ◽  
Radiation Resistant ◽  
Resolution Imaging ◽  
Alternative Approaches

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.

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