Evaluating crystal-orientation-dependent properties on polycrystalline tungsten: Example oxidation

Our understanding of the structure and the formation of inorganic minerals in the bivalve shells has been considerably advanced by the use of electron microscope. However, very little is known about the ultrastructure of valves in the larval stage of the oysters. The present study examines the developmental changes which occur between the time of conception to the early stages of Dissoconch in the Crassostrea virginica(Gmelin), focusing on the initial deposition of inorganic crystals by the oysters.The spawning was induced by elevating the temperature of the seawater where the adult oysters were conditioned. The eggs and sperm were collected separately, then immediately mixed for the fertilizations to occur. Fertilized animals were kept in the incubator where various stages of development were stopped and observed. The detailed analysis of the early stages of growth showed that CaCO3 crystals(aragonite), with orthorhombic crystal structure, are deposited as early as gastrula stage(Figuresla-b). The next stage in development, the prodissoconch, revealed that the crystal orientation is in the form of spherulites.

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Annealing Of Radiation Damage in Tungsten

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100069053 ◽

1970 ◽

Vol 28 ◽

pp. 412-413

Author(s):

Robert C. Rau ◽

John Moteff

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Radiation Damage ◽

Thermal Annealing ◽

Neutron Fluence ◽

Dislocation Loops ◽

Defect Clusters ◽

Polycrystalline Tungsten ◽

Transmission Electron ◽

Radiation Induced

Transmission electron microscopy has been used to study the thermal annealing of radiation induced defect clusters in polycrystalline tungsten. Specimens were taken from cylindrical tensile bars which had been irradiated to a fast (E > 1 MeV) neutron fluence of 4.2 × 1019 n/cm2 at 70°C, annealed for one hour at various temperatures in argon, and tensile tested at 240°C in helium. Foils from both the unstressed button heads and the reduced areas near the fracture were examined.Figure 1 shows typical microstructures in button head foils. In the unannealed condition, Fig. 1(a), a dispersion of fine dot clusters was present. Annealing at 435°C, Fig. 1(b), produced an apparent slight decrease in cluster concentration, but annealing at 740°C, Fig. 1(C), resulted in a noticeable densification of the clusters. Finally, annealing at 900°C and 1040°C, Figs. 1(d) and (e), caused a definite decrease in cluster concentration and led to the formation of resolvable dislocation loops.

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The Interpretation of Crystal Lattice Images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009600x ◽

1972 ◽

Vol 30 ◽

pp. 550-551

Author(s):

J. M. Cowley ◽

Sumio Iijima

Keyword(s):

Crystal Orientation ◽

Diffraction Theory ◽

Phase Changes ◽

Electron Wave ◽

Crystal Lattices ◽

Heavy Atoms ◽

Lattice Images ◽

The Right ◽

Intuitive Interpretation ◽

Suitable Approximation

The imaging of detailed structures of crystal lattices with 3 to 4Å resolution, given the correct conditions of microscope defocus and crystal orientation and thickness, has been used by Iijima (this conference) for the study of new types of crystal structures and the defects in known structures associated with fluctuations of stoichiometry. The image intensities may be computed using n-beam dynamical diffraction theory involving several hundred beams (Fejes, this conference). However it is still important to have a suitable approximation to provide an immediate rough estimate of contrast and an evaluation of the intuitive interpretation in terms of an amplitude object.For crystals 100 to 150Å thick containing moderately heavy atoms the phase changes of the electron wave vary by about 10 radians suggesting that the “optimum defocus” theory of amplitude contrast for thin phase objects due to Scherzer and others can not apply, although it does predict the right defocus for optimum imaging.

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