Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In situ stress and strain measurements at high pressure and temperature
2010 ◽
Vol 71
(8)
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pp. 1053-1058
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2011 ◽
Vol 31
(3)
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pp. 399-406
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2011 ◽
Vol 46
(7)
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pp. 593-606
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2008 ◽
Vol 584-586
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pp. 263-268
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1990 ◽
Vol 23
(5)
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pp. 392-396
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2009 ◽
Vol 16
(6)
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pp. 742-747
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2015 ◽
Vol 48
(2)
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pp. 578-581
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2020 ◽
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