Reveal the stacking fault shearing mechanism by its annihilation process in Ni-based single crystal superalloys

2021 ◽  
pp. 111419
Author(s):  
Pengfei Qu ◽  
Wenchao Yang ◽  
Jiarun Qin ◽  
Kaili Cao ◽  
Chen Liu ◽  
...  
CrystEngComm ◽  
2021 ◽  
Author(s):  
Bo Fu ◽  
Gaohang He ◽  
Wenxiang Mu ◽  
Yang Li ◽  
Boyuan Feng ◽  
...  

We designed an original and effective method to study the laser damage mechanism of β-Ga2O3 single crystal grown by edge-defined film-fed growth (EFG). The structure destruction under high light field...


2015 ◽  
Vol 96 ◽  
pp. 81-84
Author(s):  
Cuixia Liu ◽  
Zengyun Jian ◽  
Man Zhu ◽  
Lianyang Chen

Materials ◽  
2021 ◽  
Vol 14 (17) ◽  
pp. 5107
Author(s):  
Zhen Yang ◽  
Zhiping Zou ◽  
Zeyang Zhang ◽  
Yubo Xing ◽  
Tao Wang

Si single crystal was implanted with 230 keV He+ ions to a fluence of 5 × 1016/cm2 at 600 °C. The structural defects in Si implanted with He at 600 °C and then annealed at 1000 °C were investigated by transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM). The microstructure of an as-implanted sample is provided for comparison. After annealing, rod-like defects were diminished, while tangled dislocations and large dislocation loops appeared. Dislocation lines trapped by cavities were directly observed. The cavities remained stable except for a transition of shape, from octahedron to tetrakaidecahedron. Stacking-fault tetrahedrons were found simultaneously. Cavity growth was independent of dislocations. The evolution of observed lattice defects is discussed.


2015 ◽  
Vol 30 (22) ◽  
pp. 1550137 ◽  
Author(s):  
N. P. Kalashnikov ◽  
E. A. Mazur ◽  
A. S. Olczak

The energy and momentum conservation laws prohibit positron–electron single-photon annihilation in vacuum. It is shown that the situation is different in a single crystal with one of the leptons (e.g. positron) moving in the channeling (or in the quasi-channeling) mode. The transverse motion of an oriented or channeled particle may sharply increase the probability of the single-photon annihilation process.


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