Correlation between structural and optical properties of 30 nm and 60 nm lead sulfide nanowires

2007 ◽  
Vol 61 (25) ◽  
pp. 4659-4661 ◽  
Author(s):  
Chien Wu ◽  
Jen-Bin Shi ◽  
Chih-Jung Chen ◽  
Yu-Cheng Chen ◽  
Po-Feng Wu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Lead Sulfide ◽  
Structural And Optical Properties

scholarly journals Pulsed laser deposition to investigate structural and optical properties of lead sulfide nanostructure

2020 ◽  
Vol 18 (47) ◽  
pp. 21-32
Author(s):  
Emad J. Mohammed ◽  
Ahmed K. Abbas ◽  
Kadhim A. Aadim
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Lead Sulfide ◽  
Laser Energy ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Glass Substrates ◽  
Atomic Force ◽  
Structure Properties

In this work, the structure properties of nano Lead sulfide PbS thin films are studied. Thin samples were prepared by pulse laser deposition and deposited on glass substrates at wavelength 1064nm wavelength with a various laser energies (200,300,400,500)nm. The study of atomic force microscope (AFM) and X-ray diffraction as well as the effect of changing the laser energy on the structural properties has been studied. It has been observed that the membrane formed is of the polycrystalline type and the predominant phase is the plane (111) and (200). The minimum grain size obtained was 16.5 nm at a laser energy about 200 mJ. The results showed that thin films of average granular sizes (75 nm) could be prepared.As for the optical properties, the effect of changing the laser energy on them was studied, and it was found that they have direct allowed transitions in the range of (1.55 to 2.45) eV

Structural and Optical Properties of Cu2ZnSn(SxSe1–x)4 Thin Films

2018 ◽  
Vol 23 (3) ◽  
pp. 230-239
Author(s):  
E.P. Zaretskaya ◽  
◽  
V.F. Gremenok ◽  
A.V. Stanchik ◽  
A.N. Pyatlitski ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Structural And Optical Properties

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

Morphological, Structural, and Optical Properties of Silicon Nanostructures Formed in a Solution Containing Hydrogen Hexafluorosilicate H2(SiF6)

2020 ◽  
Vol 128 (9) ◽  
pp. 1487-1491
Author(s):  
Sh. A. Zhumatova ◽  
S. M. Manakov ◽  
Ye. Sagidolda ◽  
M. B. Darmenkulova ◽  
R. M. Azamat ◽  
...  
Keyword(s):  
Optical Properties ◽  
Silicon Nanostructures ◽  
Structural And Optical Properties
Sign in / Sign up

Export Citation Format

Share Document