Phase Change Memory: Device scaling and challenges for material engineering in the GeSbTe compound system

2015 ◽  
Vol 137 ◽  
pp. 1-4 ◽  
Author(s):  
Mattia Boniardi ◽  
Andrea Redaelli
2014 ◽  
Vol 936 ◽  
pp. 599-602
Author(s):  
You Yin ◽  
Sumio Hosaka

In this study, we investigated ultra-multilevel-storage (UMLS) in lateral phase change memory (PCM) on the basis of device structure, reliability and programming method. We found that the number of resistance levels was limited strictly by the number of PC layers in multilayer multilevel cell (ML-MLC). A number of distinct levels up to 16 were obtained using a simple single-layer multilevel cell (SL-MLC). And material engineering is expected to greatly improve the reliability of MLS. We believe that fast-freely-achievable (FFA)-MLC by stair-like-pulse programming is a very promising method for futures application.


2016 ◽  
Vol 745 ◽  
pp. 032098
Author(s):  
Jean-Luc Battaglia ◽  
Indrayush De ◽  
Abdelhak Saci ◽  
Andrzej Kusiak ◽  
Véronique Sousa

2006 ◽  
Vol 73 (21) ◽  
Author(s):  
Jae-Hyeon Eom ◽  
Young-Gui Yoon ◽  
Changwon Park ◽  
Hoonkyung Lee ◽  
Jino Im ◽  
...  

2019 ◽  
Vol 34 (10) ◽  
pp. 105019
Author(s):  
Yuan-Guang Liu ◽  
Yi-Feng Chen ◽  
Dao-Lin Cai ◽  
Yao-Yao Lu ◽  
Lei Wu ◽  
...  

Author(s):  
Sung-Min Yoon ◽  
Nam-Yeal Lee ◽  
Sang-Ouk Ryu ◽  
Kyu-Jeong Choi ◽  
Young-Sam Park ◽  
...  

2020 ◽  
Vol 53 (21) ◽  
pp. 213002 ◽  
Author(s):  
Manuel Le Gallo ◽  
Abu Sebastian

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