On the use of behavioral modeling within the RFIC design flow: Satellite receiver case study

2009 ◽  
Vol 40 (12) ◽  
pp. 1726-1735 ◽  
Author(s):  
Benjamin Nicolle ◽  
Rami Khouri ◽  
Fabien Ferrero ◽  
William Tatinian ◽  
Lorenzo Carpineto ◽  
...  
Author(s):  
Lisane Brisolara de Brisolara ◽  
Marcio Eduardo Kreutz ◽  
Luigi Carro

This chapter covers the use of UML as a modeling language for embedded systems design. It introduces the UML language, presenting the history of its definition, its main diagrams and characteristics. Using a case study, we show that using the standard UML with its limitations one is not able to model many important characteristics of embedded systems. For that reason, UML provides extension mechanisms that enable one to extend the language for a given domain, through the definition of profiles covering domain-specific applications. Several profiles have been proposed for the embedded systems domain, and some of those that have been standardized by OMG are presented here. A case study is also used to present MARTE, a new profile specifically proposed for the embedded system domain, enabling designers to model aspects like performance and schedulability. This chapter also presents a discussion about the effort to generate code from UML diagrams and analyses the open issues to the successful use of UML in the whole embedded system design flow.


2014 ◽  
Vol 878 ◽  
pp. 278-283
Author(s):  
Jia Qi Zhang ◽  
Chang Yu

Container houses have exhibited huge advantages in such aspects as building efficiency, environmental protection and sustainability. This article begins with the present situation of the transformation and application of the waste containers. Then it discusses the characteristics of the containers and provides certain references for the future transformation design of the containers through a case study of the waste containers transformation design flow.


2012 ◽  
Vol 4 (5) ◽  
pp. 515-521 ◽  
Author(s):  
Conrado K. Mesadri ◽  
Aziz Doukkali ◽  
Philippe Descamps ◽  
Christophe Kelma

In this paper, a new methodology to compare the robustness of sensor structures employed in radiofrequency design for test (RF DFT) architectures for RF integrated circuits (ICs) is proposed. First, the yield loss and defect level of the test technique is evaluated using a statistical model of the Circuit under Test (obtained through non-parametric statistics and copula theory). Then, by carrying out the dispersion analysis of the sensor architecture, a figure of merit is established. This methodology reduces the number of iterations in the design flow of RF DFT sensors and makes it possible to evaluate process dispersion. The case study is a SiGe:C BiCMOS LNA tested by a single-probe measurement.


2008 ◽  
Vol 2008 ◽  
pp. 1-9 ◽  
Author(s):  
Yang Qu ◽  
Kari Tiensyrjä ◽  
Juha-Pekka Soininen ◽  
Jari Nurmi

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