A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices
2014 ◽
Vol 38
(6)
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pp. 605-619
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2002 ◽
Vol 229
(1-2)
◽
pp. 273-281
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1999 ◽
Vol 31
(8)
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pp. 1109-1119
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Keyword(s):
1973 ◽
Vol 51
(4)
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pp. 1345-1348
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2009 ◽