UV–Vis-NIR and micro Raman spectroscopies for the non destructive identification of Cd 1−x Zn x S solid solutions in cadmium yellow pigments

2016 ◽  
Vol 124 ◽  
pp. 856-867 ◽  
Author(s):  
Francesca Rosi ◽  
Chiara Grazia ◽  
Francesca Gabrieli ◽  
Aldo Romani ◽  
Marco Paolantoni ◽  
...  
2010 ◽  
Vol 100 (3) ◽  
pp. 845-853 ◽  
Author(s):  
V. Crupi ◽  
D. Majolino ◽  
V. Venuti ◽  
G. Barone ◽  
P. Mazzoleni ◽  
...  

2013 ◽  
Vol 42 (5) ◽  
pp. 521-523 ◽  
Author(s):  
Saithathul Fathimah Sameera ◽  
Padala Prabhakar Rao ◽  
Leela Sandhya Kumari ◽  
Vineetha James ◽  
Saraswathy Divya

1999 ◽  
Vol 64 (11) ◽  
pp. 707-720
Author(s):  
N.Z. Blagojevic ◽  
R.M. Zejnilovic ◽  
A.R. Despic ◽  
Z. Blecic

The method of anodic linear sweep voltammetry (ALSV) has been used to determine the content of Zn and Cd (up to 4% w/w) in eutectic type binary alloys with Sn. The alloy samples were prepared by casting. The effect of the type and the pH of the electrolyte, as well as of the sweep-rate on the dissolution of Zn and Cd from the alloy during an anodic potentinal-sweep was investigated. It was shown that ALSV is sensitive to low concentrations of both Zn and Cd in the investigated alloys, as well-defined peaks of the dissolution of the two metals were recorded before the massive dissolution of Sn commenced. Well-defined linear dependencies between the quantities of electricity under the dissolution peaks of Zn (QZn) or Cd (QCd) and the respective contents of the metals in the alloys were found. Intercepts at the abscissa were found in both investigated systems indicating the formation of solid solutions from which neither Zn norCd could be eluted. In both alloys, the smallest amount of the alloying component which could be detected was 0.25% (w/w). The application of the ALSV method has several advantages over other analytical methods: it is non-destructive as the dissolution involves only a very thin layer of the alloy; it requires simple and cheap instrumentation; it is fast and relatively sensitive. These make it suitable for routine analysis.


2001 ◽  
Author(s):  
Swetha Sridharan ◽  
E. H. Jordan ◽  
Maurice Gell

Abstract Cr3+ photoluminescence peizo-spectroscopy (CPLPS) is a technique that allows the measurement of the hydrostatic component of stress in α alumina oxides. This method is being developed in our laboratory as a non-destructive inspection technique for thermal barrier coating systems. It has been shown that the Cr3+ concentration influences the magnitude of the shifts in the fluorescence frequencies, Δv of the R1 and the R2 peaks [1,2] and hence the apparent stress. Therefore, this work is an attempt to quantify the extent of this shift, consequent to the Cr3+ concentration in the TBC systems and to study the variation of this effect with thermal cycles on the TBCs. In addition, we have developed a method of estimating Cr3+ content based on the intensity of satellite peaks referred to as n-lines. The experiments are also designed to validate the n-line based method of estimating Cr3+ content and its affect on the apparent stress value.


2019 ◽  
Vol 109 ◽  
pp. 190-194 ◽  
Author(s):  
Hideki Hashimoto ◽  
Kotaro Sayo ◽  
Hidetaka Asoh ◽  
Tatsuo Fujii ◽  
Mikio Takano ◽  
...  

2008 ◽  
Vol 451 (1-2) ◽  
pp. 640-643 ◽  
Author(s):  
Shinya Furukawa ◽  
Toshiyuki Masui ◽  
Nobuhito Imanaka

Author(s):  
J W Steeds

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.


Author(s):  
R.F. Sognnaes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.


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