Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy

Micron ◽  
2013 ◽  
Vol 49 ◽  
pp. 1-14 ◽  
Author(s):  
F. Krumeich ◽  
E. Müller ◽  
R.A. Wepf
2019 ◽  
Vol 25 (3) ◽  
pp. 563-582 ◽  
Author(s):  
Colin Ophus

AbstractScanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we review the use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others.


2013 ◽  
Vol 19 (S2) ◽  
pp. 1238-1239
Author(s):  
G. Nicotra ◽  
Q.M. Ramasse ◽  
I. Deretzis ◽  
C. Bongiorno ◽  
C. Spinella ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


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