Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors

doi:10.1016/j.microrel.2004.07.082

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2004.07.082 ◽

2004 ◽

Vol 44 (9-11) ◽

pp. 1631-1636 ◽

Cited By ~ 4

Keyword(s):

Thin Film ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier

Download Full-text

Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistors

Journal of Applied Physics ◽

10.1063/1.1699504 ◽

2004 ◽

Vol 95 (10) ◽

pp. 5788-5794 ◽

Cited By ~ 16

Author(s):

Tien-Fu Chen ◽

Ching-Fa Yeh ◽

Jen-Chung Lou

Keyword(s):

Thin Film ◽

Grain Boundaries ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier

Download Full-text

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

Applied Physics Letters ◽

10.1063/1.126370 ◽

2000 ◽

Vol 76 (17) ◽

pp. 2442-2444 ◽

Cited By ~ 15

Author(s):

C. T. Angelis ◽

C. A. Dimitriadis ◽

F. V. Farmakis ◽

J. Brini ◽

G. Kamarinos ◽

...

Keyword(s):

Thin Film ◽

Excimer Laser ◽

Threshold Voltage ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

Download Full-text

Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1322 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1322-1327 ◽

Cited By ~ 5

Author(s):

Gen Usami ◽

Yukisato Nogami ◽

Toshihisa Yajima ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Electric Field ◽

Electron Concentration ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

Download Full-text

Hot-Carrier Effects in Short Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.024103 ◽

2012 ◽

Vol 51 (2R) ◽

pp. 024103

Author(s):

Sung-Hwan Choi ◽

Yeon-Gon Mo ◽

Hye-Dong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Short Channel ◽

Hot Carrier ◽

Hot Carrier Effects ◽

P Type

Download Full-text

Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors

Solid-State Electronics ◽

10.1016/s0038-1101(01)00002-8 ◽

2001 ◽

Vol 45 (2) ◽

pp. 365-368 ◽

Cited By ~ 3

Author(s):

C.A. Dimitriadis ◽

G. Kamarinos ◽

J. Brini

Keyword(s):

Thin Film ◽

Leakage Current ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

Download Full-text

Optimization of crystallization energy density for excimer laser annealed polycrystalline silicon thin film transistors

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7998677 ◽

2016 ◽

Author(s):

Dongyu Qi ◽

Dongli Zhang ◽

Mingxiang Wang ◽

Jianwen Li

Keyword(s):

Thin Film ◽

Energy Density ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

Download Full-text

Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.51-52.585 ◽

1996 ◽

Vol 51-52 ◽

pp. 585-596 ◽

Cited By ~ 5

Author(s):

G. Fortunato

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Silicon Thin Film ◽

Hot Carrier ◽

Kink Effect ◽

Hot Carrier Effects

Download Full-text

Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

Journal of Applied Physics ◽

10.1063/1.2777804 ◽

2007 ◽

Vol 102 (5) ◽

pp. 054508 ◽

Cited By ~ 15

Author(s):

Ming-Hsien Lee ◽

Kai-Hsiang Chang ◽

Horng-Chih Lin

Keyword(s):

Thin Film ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Effective Density ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Lateral Diffusion of Phosphorous Induced by Excimer Laser Irradiation of Silicon Thin Film for Formation of Gradual Lightly Doped Region in Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.6525 ◽

2007 ◽

Vol 46 (10A) ◽

pp. 6525-6529 ◽

Cited By ~ 1

Author(s):

Sang-Myeon Han ◽

Sang-Geun Park ◽

Seung-Yeon Seong ◽

Chi-Jung Kang ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Laser Irradiation ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Lateral Diffusion ◽

Silicon Thin Film ◽

Excimer Laser Irradiation

Download Full-text

Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors

Solid-State Electronics ◽

10.1016/s0038-1101(99)00314-7 ◽

2000 ◽

Vol 44 (6) ◽

pp. 1081-1087 ◽

Cited By ~ 12

Author(s):

C.T. Angelis ◽

C.A. Dimitriadis ◽

F.V. Farmakis ◽

J. Brini ◽

G. Kamarinos ◽

...

Keyword(s):

Thin Film ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

Download Full-text