An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect
2005 ◽
Vol 45
(7-8)
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pp. 1144-1149
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1997 ◽
Vol 44
(3)
◽
pp. 441-447
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1995 ◽
Vol 42
(8)
◽
pp. 1487-1494
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2014 ◽
Vol 54
(1)
◽
pp. 33-36
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2020 ◽
pp. 101-112
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