An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect

2005 ◽  
Vol 45 (7-8) ◽  
pp. 1144-1149 ◽  
Author(s):  
C.S. Ho ◽  
Kuo-Yin Huang ◽  
Ming Tang ◽  
Juin J. Liou
2019 ◽  
pp. 1-8
Author(s):  
T. E. Ayoob Khan ◽  
S. Salini ◽  
Geethu Maria Abraham ◽  
T. A. Shahul Hameed

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