An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2018.02.022 ◽

2018 ◽

Vol 82 ◽

pp. 62-66 ◽

Cited By ~ 1

Author(s):

Constantin Catalin Negrila ◽

Mihail Florin Lazarescu ◽

Constantin Logofatu ◽

Rodica V. Ghita ◽

Costel Cotirlan

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Gaas Structure ◽

Profile Study

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Depth-profile study of the electronic structures at Ga2O3(Gd2O3) and Gd2O3–GaN interfaces by X-ray photoelectron spectroscopy

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2004.12.128 ◽

2005 ◽

Vol 278 (1-4) ◽

pp. 624-628 ◽

Cited By ~ 21

Author(s):

T.S. Lay ◽

Y.Y. Liao ◽

W.H. Hung ◽

M. Hong ◽

J. Kwo ◽

...

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Electronic Structures ◽

X Ray ◽

Profile Study

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Non-destructive initial-profile-free depth profile evaluation of thin-film sample using angle-resolved X-ray photoelectron spectroscopy and profile smoothing regularization

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ac1fba ◽

2021 ◽

Vol 60 (10) ◽

pp. 101003

Author(s):

Yutaka Hoshina ◽

Kazuya Tokuda ◽

Yoshihiro Saito

Keyword(s):

Thin Film ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Thin Film Sample ◽

Film Sample ◽

Initial Profile ◽

X Ray ◽

Non Destructive

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X-ray photoelectron spectroscopy depth profile of chemically modified porous silicon

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2178373 ◽

2006 ◽

Vol 24 (2) ◽

pp. 852 ◽

Cited By ~ 2

Author(s):

A. Jasper Nijdam ◽

Mark Ming-Cheng Cheng ◽

Mauro Ferrari

Keyword(s):

Porous Silicon ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Chemically Modified

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Comparison of angle‐resolved x‐ray photoelectron spectroscopy/Auger electron spectroscopy with depth profile restoration from inelastic background analysis

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579210 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2337-2341 ◽

Cited By ~ 1

Author(s):

Wolfgang S. M. Werner ◽

Igor S. Tilinin

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Application of high-energy synchrotron-radiation X-ray photoelectron spectroscopy to the depth profile analysis of oxide layer on Si(100) surfaces.

BUNSEKI KAGAKU ◽

10.2116/bunsekikagaku.45.169 ◽

1996 ◽

Vol 45 (2) ◽

pp. 169-174 ◽

Cited By ~ 1

Author(s):

Hiroyuki YAMAMOTO ◽

Yuji BABA ◽

Teikichi A.SASAKI

Keyword(s):

Synchrotron Radiation ◽

Oxide Layer ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Profile Analysis ◽

High Energy ◽

Depth Profile Analysis ◽

X Ray

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Non-destructive depth profile analysis for surface and buried interface of Ge thin film on Si substrate by high-energy synchrotron radiation x-ray photoelectron spectroscopy

Journal of Physics Conference Series ◽

10.1088/1742-6596/100/1/012044 ◽

2008 ◽

Vol 100 (1) ◽

pp. 012044 ◽

Cited By ~ 3

Author(s):

H Yamamoto ◽

Y Yamada ◽

M Sasase ◽

F Esaka

Keyword(s):

Thin Film ◽

Synchrotron Radiation ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Profile Analysis ◽

High Energy ◽

Si Substrate ◽

Depth Profile Analysis ◽

X Ray ◽

Non Destructive

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Composition and Growth Behavior of the Surface and Electrolyte Decomposition Layer of/on a Commercial Lithium Ion Battery LixNi1/3Mn1/3Co1/3O2 Cathode Determined by Sputter Depth Profile X-ray Photoelectron Spectroscopy

Langmuir ◽

10.1021/la403276p ◽

2013 ◽

Vol 29 (51) ◽

pp. 15813-15821 ◽

Cited By ~ 55

Author(s):

Philip Niehoff ◽

Martin Winter

Keyword(s):

Lithium Ion Battery ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Lithium Ion ◽

Growth Behavior ◽

X Ray

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X-Ray Photoelectron Spectroscopy Sputter Depth Profile Analysis of Spatially Controlled Microstructures in Conductive Polymer Films

Analytical Chemistry ◽

10.1021/ac00001a600 ◽

1991 ◽

Vol 63 (1) ◽

pp. 60-65 ◽

Cited By ~ 12

Author(s):

Susan G. MacKay ◽

Mohammad. Bakir ◽

Inga H. Musselman ◽

Thomas J. Meyer ◽

Richard W. Linton

Keyword(s):

Depth Profile ◽

Polymer Films ◽

Photoelectron Spectroscopy ◽

Profile Analysis ◽

Conductive Polymer ◽

Depth Profile Analysis ◽

X Ray

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An X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium

Applied Surface Science ◽

10.1016/s0169-4332(98)00927-1 ◽

1999 ◽

Vol 143 (1-4) ◽

pp. 92-100 ◽

Cited By ~ 215

Author(s):

E McCafferty ◽

J.P Wightman

Keyword(s):

Oxide Film ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Profile Study

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Compositional Depth Profile of a Native Oxide LPCVD MNOS Structure Using X‐Ray Photoelectron Spectroscopy and Chemical Etching

Journal of The Electrochemical Society ◽

10.1149/1.2119784 ◽

1983 ◽

Vol 130 (3) ◽

pp. 691-699 ◽

Cited By ~ 32

Author(s):

J. A. Wurzbach ◽

F. J. Grunthaner

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Chemical Etching ◽

Native Oxide ◽

X Ray ◽

Compositional Depth Profile

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