Quantitative analysis on the oxygen diffusion in pyramidal textured surfaces of silicon and copper via transmission electron microscopy

2021 ◽  
Vol 121 ◽  
pp. 105464
Author(s):  
C. Wen ◽  
B.Y. Cao ◽  
Z.Q. Shi ◽  
Y.J. Ma ◽  
J.X. Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantitative Analysis ◽  
Oxygen Diffusion ◽  
Textured Surfaces ◽  
Transmission Electron

Low-temperature annealing of YBa2Cu3O7-x

1992 ◽  
Vol 50 (1) ◽  
pp. 88-89
Author(s):  
R.L. Sabatini ◽  
Yimei Zhu ◽  
Masaki Suenaga ◽  
A.R. Moodenbaugh
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Low Temperature ◽  
Oxygen Diffusion ◽  
Diffusion Rate ◽  
Oxygen Depletion ◽  
Low Temperature Annealing ◽  
Transmission Electron ◽  
Microstructural Effects ◽  
Oxygen Diffusion Rate

Low temperature annealing (<400°C) of YBa2Cu3O7x in a ozone containing oxygen atmosphere is sometimes carried out to oxygenate oxygen deficient thin films. Also, this technique can be used to fully oxygenate thinned TEM specimens when oxygen depletion in thin regions is suspected. However, the effects on the microstructure nor the extent of oxygenation of specimens has not been documented for specimens exposed to an ozone atmosphere. A particular concern is the fact that the ozone gas is so reactive and the oxygen diffusion rate at these temperatures is so slow that it may damage the specimen by an over-reaction. Thus we report here the results of an investigation on the microstructural effects of exposing a thinned YBa2Cu3O7-x specimen in an ozone atmosphere using transmission electron microscopy and energy loss spectroscopy techniques.

Microstructural characterization of laser-irradiated bulk copper under dry sliding conditions

2012 ◽  
Vol 226 (6) ◽  
pp. 541-551 ◽  
Author(s):  
Brice Raillard ◽  
Carsten Gachot ◽  
Michael Hans ◽  
Peter Leibenguth ◽  
Frank Mücklich
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Friction And Wear ◽  
Wear Behaviour ◽  
Dry Sliding ◽  
Textured Surfaces ◽  
Laser Interference ◽  
Electron Backscattering ◽  
Electron Backscattering Diffraction ◽  
Transmission Electron

The functionalization of surfaces for tribological applications is still a challenging task. There are numerous techniques for improving the friction and wear behaviour of metallic surfaces ranging from different coatings to textured surfaces. A promising approach for textured surfaces is the usage of laser interference patterning by a pulsed nanosecond Nd:YAG laser. Copper samples have been laser patterned using the laser interference metallurgy process. The resulting topographies were evaluated by white light interferometry and scanning electron microscopy in order to study the homogeneity of the structures at both macro- and micro-scales. Electron backscattering diffraction and transmission electron microscopy were performed in order to study the microstructural and oxide layer modifications induced by laser irradiation. Electron backscattering diffraction measurement did not show fine grains but a small proportion of misorientation due to the high quenching rate. Transmission electron microscopy did not allow to observe oxide layers. The friction and wear behaviour of bulk copper samples structured by laser interference metallurgy have been studied under dry sliding conditions using a tribometer in linear reciprocating sliding mode. Friction coefficient measurements revealed that patterned surfaces present a reduction in friction of up to 70% compared to untreated samples due to their good bearing properties and the reduction of the contact area.

The proboscis ciliation of the echiuran Bonellia viridis

1979 ◽  
Vol 59 (2) ◽  
pp. 377-384 ◽  
Author(s):  
V. Jaccarini ◽  
P. J. Schembri
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantitative Analysis ◽  
Light And Electron Microscopy ◽  
Neck Region ◽  
Dorsal Surface ◽  
Food Particle ◽  
Particle Uptake ◽  
Transmission Electron ◽  
Definite Pattern

Special club-shaped cilia with an expanded tip are seen by both light and electron microscopy on the proboscis of Bonellia viridis in addition to the usual filamentous cilia. Using transmission electron microscopy the club tip is seen to consist of a distally curled axoneme enclosed within a sac-like expansion of the ciliary membrane. The axoneme may describe up to two complete loops inside the membrane sac or may occasionally follow an S-shaped course.A quantitative analysis of the distribution on the proboscis of both filamentous and club cilia is made. No discrete ciliary tracts are present. However, there is a definite pattern of ciliary density distribution. The cilia are densest on both the dorsal and ventral surfaces of the distal fringe of the proboscis. The dorsal fringe cilia are concerned with locomotion and the ventral cilia with food particle uptake. The club cilia are confined to the terminal lobes and neck region of the proboscis. The dorsal surface of the proboscis posterior to the fringe is virtually non-ciliated. The functional significance of the club cilia is discussed.

Theoretical and Experimental Description of Interface Structure

1986 ◽  
Vol 77 ◽  
Author(s):  
R. Hull ◽  
K. W. Carey ◽  
G. A. Reid
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantitative Analysis ◽  
High Resolution ◽  
Electronic Properties ◽  
Lattice Structure ◽  
Dissimilar Materials ◽  
Interface Structure ◽  
Transmission Electron ◽  
Optical And Electronic Properties

ABSTRACTWe define the Interface between two dissimilar materials by two functions, g(z) and f(x,y), representing the diffuseness along the interface normal and the distribution of interface non-planarities respectively. We show how these functions may be measured for the case of epitaxial interfaces between dissimilar crystals by quantitative analysis of lattice structure images obtained by high resolution transmission electron microscopy. Experimental examples are drawn from the GeSi/Si, InGaAs/InAlAs and InGaAs/InP systems. Correlations between interface structure and optical and electronic properties of these systems are discussed.

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