Computer simulation of high-energy-beam irradiation of single-crystalline silicon

2007 ◽  
Vol 264 (2) ◽  
pp. 259-266 ◽  
Author(s):  
Y. Sasajima ◽  
T. Akabane ◽  
T. Nakazawa ◽  
A. Iwase
Keyword(s):  
Computer Simulation ◽  
Crystalline Silicon ◽  
High Energy ◽  
Single Crystalline Silicon ◽  
Beam Irradiation ◽  
Single Crystalline ◽  
Energy Beam ◽  
High Energy Beam

scholarly journals Computer simulation of high-energy-beam irradiation of β-cristobalite

2013 ◽  
Vol 38 (3) ◽  
pp. 497-502 ◽  
Author(s):  
Y. Sasajima ◽  
H. Onuki ◽  
N. Ishikawa ◽  
A. Iwase
Keyword(s):  
Computer Simulation ◽  
High Energy ◽  
Beam Irradiation ◽  
Energy Beam ◽  
High Energy Beam

Nanomechanical Properties of Single-Crystalline Silicon Wafer Irradiated by High-Energy Femtosecond Laser Pulses

2006 ◽  
Vol 315-316 ◽  
pp. 159-163
Author(s):  
Yan Shen Wang ◽  
Ying Chun Liang ◽  
Shen Dong ◽  
Wei Wei An ◽  
Bo Wang
Keyword(s):  
Femtosecond Laser ◽  
Silicon Wafer ◽  
Crystalline Silicon ◽  
Laser Pulses ◽  
High Energy ◽  
Femtosecond Laser Pulses ◽  
Back Surface ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Nanomechanical Properties

High-energy femtosecond laser pulses were utilized to ablate single-crystalline silicon wafer. Collateral damage areas around the ablation zone can be observed in microscope. The morphology in such areas changes gradually. The microscopic morphology and nanomechanical properties of the pre-polished back surface were measured by AFM and Hysitron TriboIndenter respectively. The topography and roughness in the ablated, metamorphic and unaffected zone are almost equal. Yet the elastic ratio and hardness on the back surface vary gradually with indent positions, which coincide with the gradual morphological changes in the metamorphic zone on the front surface. Such regular changes in nanomechanical properties, to some extent, reflect the distribution of collateral damages near the ablated zone on the back surface. And they also testify the occurrence of the ill effects that go against micromachining during high-energy femtosecond laser irradiation.

scholarly journals Research into Silicon Nanoparticles as Agents for UHF Hyperthermia In Vitro

2021 ◽  
Vol 7 (1) ◽  
pp. 010306
Author(s):  
Аngelina Kosheleva ◽  
Еgor Bobkov
Keyword(s):  
Cancer Treatment ◽  
High Frequency ◽  
Silicon Nanoparticles ◽  
External Action ◽  
High Energy ◽  
Beam Irradiation ◽  
Energy Beam ◽  
Selective Heating ◽  
High Energy Beam

The current approaches to cancer treatment, including surgery and high-energy beam irradiation, do not always give satisfactory results for a number of oncological neoplasms. One of the promising areas in oncology is the use of nanoparticles selectively heated by external action as agents for hyperthermia of some types of tumors. In this work, we performed selective heating of suspensions of silicon nanoparticles using a device for electromagnetic high-frequency therapy (UHF-60).

Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer

2013 ◽  
Vol 58 (2) ◽  
pp. 142-150 ◽  
Author(s):  
A.V. Sachenko ◽  
◽  
V.P. Kostylev ◽  
V.G. Litovchenko ◽  
V.G. Popov ◽  
...  
Keyword(s):  
Surface Layer ◽  
Crystalline Silicon ◽  
Silicon Wafers ◽  
Single Crystalline Silicon ◽  
Near Surface ◽  
Single Crystalline

A topologically connected multistrip crystal for efficient steering of high-energy beam

2012 ◽  
Vol 7 (04) ◽  
pp. P04002-P04002 ◽  
Author(s):  
E Bagli ◽  
L Bandiera ◽  
P Dalpiaz ◽  
V Guidi ◽  
A Mazzolari ◽  
...  
Keyword(s):  
High Energy ◽  
Energy Beam ◽  
High Energy Beam

A Nonsaturable High‐Energy Beam Monitor

1955 ◽  
Vol 26 (2) ◽  
pp. 229-231 ◽  
Author(s):  
G. W. Tautfest ◽  
H. R. Fechter
Keyword(s):  
High Energy ◽  
Energy Beam ◽  
Beam Monitor ◽  
High Energy Beam
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