Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

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A. Hess ◽  
A. Cröll ◽  
D. Allen ◽  
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2007 ◽  
Vol 19 (19) ◽  
pp. 4731-4740 ◽  
Author(s):  
Phillip M. Mallinson ◽  
John B. Claridge ◽  
Matthew J. Rosseinsky ◽  
Richard M. Ibberson ◽  
Jonathan P. Wright ◽  
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2000 ◽  
Vol 71 (11) ◽  
pp. 4177 ◽  
Author(s):  
Margret J. Geselbracht ◽  
Richard I. Walton ◽  
E. Sarah Cowell ◽  
Franck Millange ◽  
Dermot O’Hare

ChemInform ◽  
2007 ◽  
Vol 38 (48) ◽  
Author(s):  
Phillip M. Mallinson ◽  
John B. Claridge ◽  
Matthew J. Rosseinsky ◽  
Richard M. Ibberson ◽  
Jonathan P. Wright ◽  
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1993 ◽  
Vol 03 (C9) ◽  
pp. C9-461-C9-467 ◽  
Author(s):  
M. Juez-Lorenzo ◽  
V. Kolarik ◽  
N. Eisenreich ◽  
W. Engel ◽  
A. J. Criado

1994 ◽  
Vol 166-169 ◽  
pp. 361-366 ◽  
Author(s):  
Maria Juez-Lorenzo ◽  
Vladislav Kolarik ◽  
N. Eisenreich ◽  
W. Engel ◽  
A.J. Criado

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