Surface analysis of pyrite in the No. 9 coal seam, Wuda Coalfield, Inner Mongolia, China, using high-resolution time-of-flight secondary ion mass-spectrometry

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Surface and trace analysis by high‐resolution time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576009 ◽

1989 ◽

Vol 7 (3) ◽

pp. 1823-1828 ◽

Cited By ~ 25

Author(s):

E. Niehuis ◽

T. Heller ◽

U. Jürgens ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Trace Analysis ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Analysis of surface contaminants on gallium arsenide and silicon by high-resolution time-of-flight secondary ion mass spectrometry

10.1116/1.584777 ◽

1989 ◽

Vol 7 (3) ◽

pp. 512 ◽

Cited By ~ 20

Author(s):

E. Niehuis

Keyword(s):

Mass Spectrometry ◽

Gallium Arsenide ◽

High Resolution ◽

Time Of Flight ◽

Resolution Time ◽

Surface Contaminants ◽

Ion Mass Spectrometry ◽

Development of Source Apportionment of Individual Particle by High Resolution Time of Flight-Secondary Ion Mass Spectrometry

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.55.104 ◽

2012 ◽

Vol 55 (3) ◽

pp. 104-107 ◽

Cited By ~ 3

Author(s):

Norihito MAYAMA ◽

Eita GOTO ◽

Yusuke MIURA ◽

Kenji OHISHI ◽

Tetsuo SAKAMOTO ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Source Apportionment ◽

Time Of Flight ◽

Individual Particle ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Cited By ~ 5

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Surface analysis of plasma-deposited polymer films by Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) before and after exposure to ambient air

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2005.02.032 ◽

2005 ◽

Vol 200 (1-4) ◽

pp. 463-467 ◽

Cited By ~ 23

Author(s):

U. Oran ◽

S. Swaraj ◽

J.F. Friedrich ◽

W.E.S. Unger

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Polymer Films ◽

Time Of Flight ◽

Ambient Air ◽

Ion Mass Spectrometry ◽

Before And After ◽

Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysis

The Analyst ◽

10.1039/b402607c ◽

2004 ◽

Vol 129 (6) ◽

pp. 483-487 ◽

Cited By ~ 195

Author(s):

Rana N. S. Sodhi

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

High mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignments

Surface and Interface Analysis ◽

10.1002/sia.740140307 ◽

1989 ◽

Vol 14 (3) ◽

pp. 135-142 ◽

Cited By ~ 53

Author(s):

E. Niehuis ◽

P. N. T. Van Velzen ◽

J. Lub ◽

T. Heller ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Mass Resolution ◽

High Mass ◽

Resolution Time ◽

High Mass Resolution ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Mass Spectrometry Application

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

10.1016/j.nimb.2010.02.045 ◽

2010 ◽

Vol 268 (11-12) ◽

pp. 1714-1717 ◽

Cited By ~ 18

Author(s):

Brian N. Jones ◽

Vladimir Palitsin ◽

Roger Webb

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Time Of Flight ◽

High Energy ◽

Ion Mass Spectrometry ◽

Pixe And Rbs ◽

High-Resolution Epifluorescence and Time-of-Flight Secondary Ion Mass Spectrometry Chemical Imaging Comparisons of Single DNA Microarray Spots

Analytical Chemistry ◽

10.1021/ac3019334 ◽

2012 ◽

Vol 84 (24) ◽

pp. 10628-10636 ◽

Cited By ~ 17

Author(s):

Archana N. Rao ◽

Nicolas Vandencasteele ◽

Lara J. Gamble ◽

David W. Grainger

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Dna Microarray ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Topography Measurements Using High Mass Resolution Time-of-Flight Secondary Ion Mass Spectrometry: Application to Banknotes

Analytical Chemistry ◽

10.1021/acs.analchem.9b00114 ◽

2019 ◽

Vol 91 (14) ◽

pp. 8864-8872 ◽

Cited By ~ 3

Author(s):

Alice Bejjani ◽

Manale Noun ◽

Serge Della-Negra ◽

Raymond Tannous ◽

Georges Chalhoub ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Mass Resolution ◽

High Mass ◽

Resolution Time ◽

High Mass Resolution ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Mass Spectrometry Application