Thermal spike model interpretation of sputtering yield data for Bi thin films irradiated by MeV 84Kr15+ ions

Author(s):  
S. Mammeri ◽  
S. Ouichaoui ◽  
H. Ammi ◽  
C.A. Pineda-Vargas ◽  
A. Dib ◽  
...  
Author(s):  
G. Szenes ◽  
K. Havancsák ◽  
V. Skuratov ◽  
P. Hanák ◽  
L. Zsoldos ◽  
...  

Author(s):  
M. Bender ◽  
H. Kollmus ◽  
H. Reich-Sprenger ◽  
M. Toulemonde ◽  
W. Assmann

1997 ◽  
Vol 248-249 ◽  
pp. 21-32 ◽  
Author(s):  
C. Dufour ◽  
S. Hemon ◽  
F. Gourbilleau ◽  
E. Paumier ◽  
E. Dooryhee

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