Thermal spike model interpretation of sputtering yield data for Bi thin films irradiated by MeV 84Kr15+ ions
2015 ◽
Vol 354
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pp. 235-239
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Keyword(s):
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2011 ◽
Vol 269
(14)
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pp. 1646-1649
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2000 ◽
Vol 166-167
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pp. 933-937
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2009 ◽
Vol 267
(6)
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pp. 885-890
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1997 ◽
Vol 248-249
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pp. 21-32
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2008 ◽
pp. 81-93
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1997 ◽
Vol 246
(2-3)
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pp. 244-246
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