scholarly journals Space applications of GAGG:Ce scintillators: a study of afterglow emission by proton irradiation

Author(s):  
Giuseppe Dilillo ◽  
Nicola Zampa ◽  
Riccardo Campana ◽  
Fabio Fuschino ◽  
Giovanni Pauletta ◽  
...  
Author(s):  
Hadi Afshari ◽  
Brandon K Durant ◽  
Khalid Hossain ◽  
Dmitry Poplavskyy ◽  
Bibhudutta Rout ◽  
...  

2020 ◽  
Vol 1 (6) ◽  
pp. 2068-2073
Author(s):  
Walter O. Herrera Martínez ◽  
Paula Giudici ◽  
Natalia B. Correa Guerrero ◽  
M. Luján Ibarra ◽  
M. Dolores Perez

10 MeV proton irradiation of a MAPbI3 thin film causes PbO formation when the surface is exposed to an O2 atmosphere.


2011 ◽  
Vol 679-680 ◽  
pp. 551-554
Author(s):  
D. Kurt Gaskill ◽  
Jun Hu ◽  
X. Xin ◽  
Jian Hui Zhao ◽  
Brenda L. VanMil ◽  
...  

The effects of proton irradiation on uv 4H-SiC single photon avalanche photodiodes (SPADs) are reported. The SPADs, grown by chemical vapor deposition, were designed for uv operation with dark count rates (DCR) of about 30 kHz and single photon detection efficiency (SPDE) of 4.89%. The SPADs were irradiated with 2 MeV protons to a fluence of 1012 cm-2. After irradiation, the I-V characteristics show forward voltage (<1.9 V) generation-recombination currents 2 to 3 times higher than before irradiation. Single photon counting measurements imply generation-recombination centers created in the band gap after irradiation. For threshold voltage ranging from 23 to 26 mV, the 4H-SiC SPAD showed low DCR (<54 kHz) and high SPDE (>1%) after irradiation. The SPADs demonstrated proton radiation tolerance for geosynchronous space applications.


2019 ◽  
Vol 10 (22) ◽  
pp. 6990-6995 ◽  
Author(s):  
Shusaku Kanaya ◽  
Gyu Min Kim ◽  
Masashi Ikegami ◽  
Tsutomu Miyasaka ◽  
Kohtaku Suzuki ◽  
...  

2019 ◽  
Vol 7 (29) ◽  
pp. 8905-8914 ◽  
Author(s):  
Julie V. Logan ◽  
Michael P. Short ◽  
Preston T. Webster ◽  
Christian P. Morath ◽  
Elizabeth H. Steenbergen

Proton irradiation typical of detector lifetime in orbit does not change semiconductor chemistry sufficiently through transmutation to alter device performance.


2008 ◽  
Vol 48 (8-9) ◽  
pp. 1202-1207 ◽  
Author(s):  
M.L. Bourqui ◽  
L. Béchou ◽  
O. Gilard ◽  
Y. Deshayes ◽  
P. Del Vecchio ◽  
...  

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