Generation of strongly squeezed states for a cavity field with a single atom

2007 ◽  
Vol 273 (2) ◽  
pp. 460-463 ◽  
Author(s):  
Shi-Biao Zheng
2013 ◽  
Vol 27 (31) ◽  
pp. 1350226
Author(s):  
JI HUI TENG ◽  
HONG FU WANG ◽  
XUE XI YI

The emission spectrum of a single atom inside an optomechanical cavity is studied in this paper. Our model consists of a single two-level atom coupled to a cavity with a moving end mirror. We numerically calculate the emission spectrum of the atom, taking the effect of the moving mirror into account. The dependence of the spectrum peak on the coupling between the moving mirror and the cavity field is analyzed. For weak cavity-mirror couplings, we expand the spectrum up to the first order of the coupling constant.


2002 ◽  
Vol 65 (2) ◽  
Author(s):  
Young-Tak Chough ◽  
Sun-Hyun Youn ◽  
Hyunchul Nha ◽  
Sang Wook Kim ◽  
Kyungwon An

2002 ◽  
Vol 16 (26) ◽  
pp. 981-990
Author(s):  
XIAN-TING LIANG

In this paper, we investigate the phase shift and absorbed probability of photons in a single atom high Q cavity. It is shown that by adjusting the coupling constant of interaction between atom and cavity field we can obtain a large, stable phase shift with low absorption of photons, which is needed by a qubit for quantum computation. Cavity quantum electrodynamics (QED) and supersymmetry are used in the analysis.


2010 ◽  
Vol 283 (5) ◽  
pp. 737-740 ◽  
Author(s):  
Magdalena Stobińska ◽  
Markus Sondermann ◽  
Gerd Leuchs

2015 ◽  
Vol 48 (11) ◽  
pp. 115501 ◽  
Author(s):  
Neha Aggarwal ◽  
Aranya B Bhattacherjee ◽  
Arup Banerjee ◽  
Man Mohan
Keyword(s):  

Open Physics ◽  
2014 ◽  
Vol 12 (10) ◽  
Author(s):  
Wen-Xing Yang ◽  
Ai-Xi Chen ◽  
Ting-Ting Zha ◽  
Yanfeng Bai ◽  
Ray-Kuang Lee

AbstractWe demonstrate the generation of two-mode continuous-variable (CV) entanglement in a V-type three-level atom trapped in a doubly resonant cavity using a microwave field driving a hyperfine transition between two upper excited states. By numerically simulating the dynamics of this system, our results show that the CV entanglement with large mean number of photons can be generated even in presence of the atomic relaxation and cavity losses. More interestingly, it is found that the intensity and period of entanglement can be enhanced significantly with the increasing of the atomic relaxation due to the existence of the perfect spontaneously generated interference between two atomic decay channels. Moreover, we also show that the entanglement can be controlled efficiently by tuning the intensity of spontaneously generated interference and the detuning of the cavity field.


2018 ◽  
Vol 15 (6) ◽  
pp. 065206
Author(s):  
Pu Liu ◽  
Lituo Shen ◽  
Zhenbiao Yang

Author(s):  
Wah Chi

Resolution and contrast are the important factors to determine the feasibility of imaging single heavy atoms on a thin substrate in an electron microscope. The present report compares the atom image characteristics in different modes of fixed beam dark field microscopy including the ideal beam stop (IBS), a wire beam stop (WBS), tilted illumination (Tl) and a displaced aperture (DA). Image contrast between one Hg and a column of linearly aligned carbon atoms (representing the substrate), are also discussed. The assumptions in the present calculations are perfectly coherent illumination, atom object is represented by spherically symmetric potential derived from Relativistic Hartree Fock Slater wave functions, phase grating approximation is used to evaluate the complex scattering amplitude, inelastic scattering is ignored, phase distortion is solely due to defocus and spherical abberation, and total elastic scattering cross section is evaluated by the Optical Theorem. The atom image intensities are presented in a Z-modulation display, and the details of calculation are described elsewhere.


Author(s):  
J. J. Hren ◽  
S. D. Walck

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.


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