Electrical resistivity due to soft phonon (SPR) is proposed. To test SPR, resistivity measurements have been carried out for conductive single-crystal samples of the SrTiO 3 system; Sr 1-x La x TiO 3, SrTi 1-y Nb y O 3 and SrTiO 3 implanted with Fe, Cr or B. Experiments reveal a weak SPR for Sr 1-x La x TiO 3, but no noticeable SPR was found for SrTi 1-y Nb y O 3. Resistivity measurements on the ion-implanted specimens reveal rather profound SPR for low-dose (semiconducting) specimens but weak SPR for high-dose (metallic) specimens. These results indicate that the magnitude of SPR may be carrier-concentration dependent or crystallinity dependent. A possible profound SPR is proposed for SrTiO 3 under optical illumination and superlattices. Also proposed is a potential application of SPR to soft-phonon devices (SPD).
Lattice displacement and electrical property of Li-ion implanted GaN single crystal
