Recent Development in Emerging Phosphorene Based Novel Materials: Progress, Challenges, Prospects and their Fascinating Sensing Applications

Recently, novel materials such as semiconductor metal oxide (SMO) nanowires (NWs), carbon nanotubes (CNTs), and hybrid materials SMO/CNTs have been attractively received attention for gas sensing applications. These materials are potential candidates for improving the well known “3S”: Sensitivity, Selectivity and Stability. In this article, we describe our recent studies on synthesis and characterizations of nanomaterials for gas-sensing applications. The focused topics include are: (i) various system of hybrid materials made CNTs and SMO; and (ii) quasi-one-dimension (Q1D) nanostructure of SMO materials. The synthesis, characterizations and gas-sensing properties are deal thoroughly. Gas-sensing mechanism of those materials, possibility producing new novel materials and other novel applications are also discussed

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Chemically Synthesized Novel Materials for Gas-Sensing Applications Based on Metal Oxide Nanostructure

Chemically Deposited Nanocrystalline Metal Oxide Thin Films ◽

10.1007/978-3-030-68462-4_28 ◽

2021 ◽

pp. 807-820

Author(s):

David C. Iwueke ◽

Raphael M. Obodo ◽

Chinedu Iroegbu ◽

Ishaq Ahmad ◽

Fabian I. Ezema

Keyword(s):

Metal Oxide ◽

Gas Sensing ◽

Novel Materials ◽

Sensing Applications

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A review on fluorescent inorganic nanoparticles for optical sensing applications

RSC Advances ◽

10.1039/c5ra24987b ◽

2016 ◽

Vol 6 (26) ◽

pp. 21624-21661 ◽

Cited By ~ 80

Author(s):

Sing Muk Ng ◽

Masilamany Koneswaran ◽

Ramaier Narayanaswamy

Keyword(s):

Chemical Sensing ◽

Optical Sensing ◽

Inorganic Nanoparticles ◽

Novel Materials ◽

Sensing Applications

Fluorescent inorganic nanoparticles are immerging novel materials that can be adopted for a large number of optical bioassays and chemical sensing probes.

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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Computer simulation study about the dependence of amorphous silicon photonic waveguides efficiency on the material quality

The European Physical Journal Applied Physics ◽

10.1051/epjap/2020190250 ◽

2020 ◽

Vol 90 (3) ◽

pp. 30502

Author(s):

Alessandro Fantoni ◽

João Costa ◽

Paulo Lourenço ◽

Manuela Vieira

Keyword(s):

Amorphous Silicon ◽

High Throughput Screening ◽

Simulation Analysis ◽

Low Cost ◽

Deposition Process ◽

Large Area ◽

Sidewall Roughness ◽

Sensing Applications ◽

Fabrication Defects ◽

The Impact

Amorphous silicon PECVD photonic integrated devices are promising candidates for low cost sensing applications. This manuscript reports a simulation analysis about the impact on the overall efficiency caused by the lithography imperfections in the deposition process. The tolerance to the fabrication defects of a photonic sensor based on surface plasmonic resonance is analysed. The simulations are performed with FDTD and BPM algorithms. The device is a plasmonic interferometer composed by an a-Si:H waveguide covered by a thin gold layer. The sensing analysis is performed by equally splitting the input light into two arms, allowing the sensor to be calibrated by its reference arm. Two different 1 × 2 power splitter configurations are presented: a directional coupler and a multimode interference splitter. The waveguide sidewall roughness is considered as the major negative effect caused by deposition imperfections. The simulation results show that plasmonic effects can be excited in the interferometric waveguide structure, allowing a sensing device with enough sensitivity to support the functioning of a bio sensor for high throughput screening. In addition, the good tolerance to the waveguide wall roughness, points out the PECVD deposition technique as reliable method for the overall sensor system to be produced in a low-cost system. The large area deposition of photonics structures, allowed by the PECVD method, can be explored to design a multiplexed system for analysis of multiple biomarkers to further increase the tolerance to fabrication defects.

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