The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study
2007 ◽
Vol 154
(5)
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pp. H365
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2000 ◽
Vol 39
(Part 2, No. 4B)
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pp. L351-L353
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2013 ◽
Vol 52
(10S)
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pp. 10MA05
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1989 ◽
Vol 43
(1-4)
◽
pp. 242-247
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