Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples
2010 ◽
Vol 65
(2)
◽
pp. 167-170
◽
Keyword(s):
X Ray
◽
2018 ◽
Vol 143
◽
pp. 18-25
◽
2001 ◽
Vol 56
(11)
◽
pp. 2235-2246
◽
2021 ◽
Vol 175
◽
pp. 106012
Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry
1991 ◽
Vol 35
(B)
◽
pp. 941-946
◽
Keyword(s):
X Ray
◽
2005 ◽
Vol 103
(3)
◽
pp. 277-290
◽
2014 ◽
Vol 300
(1)
◽
pp. 137-145
◽
2007 ◽
Vol 62
(5)
◽
pp. 481-484
◽